An object of the present invention is to decrease the resistance of a power supply line, to suppress a voltage drop in the power supply line, and to prevent defective display. A connection terminal portion includes a plurality of connection terminals. The plurality of connection terminals is provided with a plurality of connection pads which is part of the connection terminal. The plurality of connection pads includes a first connection pad and a second connection pad having a line width different from that of the first connection pad. Pitches between the plurality of connection pads are equal to each other.

Semiconductor device and display device

To realize a semiconductor memory device whose capacitance value per unit area in a memory cell is increased without increase in the area of the memory cell The memory cell includes a transistor, a memory element, a first capacitor, and a second capacitor The first capacitor includes a semiconductor film, a gate insulating film, and a gate electrode which are included in the transistor and is formed at the same time as the transistor The second capacitor includes an electrode which is included in the memory element and an insulating film and an electrode which are formed over the electrode Further, the second capacitor is formed over the first capacitor In this manner, the first capacitor and the second capacitor which are connected in parallel with the memory element are formed

Semiconductor Memory Device

Noise detection is performed by using the output of the phase comparator that the PLL comprises. The phase comparator outputs a signal that is based on the phase difference between the output of the voltage controlled oscillator and the reference signal. The phase difference reflects the effect of noise on the PLL and, in addition to the characteristics of the noise itself, such as the wave height value of the noise and the frequency component thereof, reflects the tolerance of the PLL to noise, whereby the level of risk that the system can actually be caused to malfunction can be judged.

Noise detection device

Provided is a noise measurement apparatus that measures noise at a location under measurement, comprising a self-excited oscillator that is provided at the location under measurement and that outputs an oscillation signal in which is sequentially accumulated, in each cycle, the noise at the location under measurement; a transmission path that transmits the oscillation signal output by the self-excited oscillator; and a measuring unit that measures noise added to the oscillation signal transmitted through the transmission path. The measuring unit may measure the noise at the location under measurement by differentiating noise added to the oscillation signal transmitted through the transmission path.

Noise measurement apparatus and test apparatus

According to an aspect, a semiconductor device and an IO-cell include a plurality of first power supply lines and a plurality of second power supply lines alternately arranged in a first direction, the first and second power supply lines each being supplied with electric power in which the voltage of the electric power supplied to the first power supply is different from that supplied to the second power supply, and a third power supply line formed in a wiring layer different from a wiring layer in which the first and second power supply lines are arranged, the third power supply line being connected to adjacent first power supply lines among the plurality of first power supply lines through a via, in which all of the first, second and third power supply lines are formed so as to extend in a second direction perpendicular to the first direction.

Semiconductor device and IO-cell

PROBLEM TO BE SOLVED: To provide a power supply line in a semiconductor integrated circuit in which parasitic capacitance between power supply lines is increased without increasing the area of the semiconductor integrated circuit and, as a result, noise on the power supply line is absorbed and the effect of external noise is eliminated. SOLUTION: Positive power supply line layers 45 and negative power supply line layers 46 are arranged alternatelyat a specified interval on a first interconnect layer 13. Negative power supply line layers 47 facing the positive power supply line layers 45 and positive power supply line layers 48 facing the negative power supply line layers 46 are arranged alternately at a specified interval on a second interconnect layer 14. Interdigitatal parts 31, 32 provided at the end of the positive power supply line layers 45 and 48, respectively, are connected electrically through via holes 21. Interdigitatal parts 33, 34 provided at the end of the negative power supply line layers 46 and 47, respectively, are connected electrically through via holes 22.

Capacitive element in semiconductor integrated circuit and its power supply line

PROBLEM TO BE SOLVED: To reliably prevent the theft and loss of a private key and secure security protection by not providing a decoding means to an information processing device itself but providing the decoding means to an image outputting means. SOLUTION: The image output device comprises the decoding means for, when receiving encrypted electronic image information encrypted with a public key paired with a private key of public key cryptography, decoding the encrypted electronic image information with the private key, a visible image printing means for printing the electronic image information decoded by the decoding means as a visible image, and a public key outputting means for outputting the public key of public key cryptography. COPYRIGHT: (C)2005,JPO&NCIPI

Image output device and encrypted information printing system

PROBLEM TO BE SOLVED: To detect noise generated in a semiconductor integrated circuit without bringing a probe directly in contact with a semiconductor integrated circuit even when an exclusive pad for detecting noise is removed. SOLUTION: An oscillator 2 composed of a ring oscillator or a voltage controlled oscillator is mounted on the semiconductor integrated circuit 1 having a digital circuit and an analog circuit, and a jitter value from the oscillator 2 is measured by a jitter measuring circuit 3, so that a substrate current generated due to the ON/OFF of the digital circuit can be caught. COPYRIGHT: (C)2003,JPO

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Papers

Capacitive element in semiconductor integrated circuit and its power supply line

Image output device and encrypted information printing system

Noise detector and semiconductor integrated circuit

重一 笠井

Papers

Capacitive element in semiconductor integrated circuit and its power supply line

Image output device and encrypted information printing system

Noise detector and semiconductor integrated circuit

重一笠井