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Showing papers by "Incyte published in 1984"

Proceedings Article•
Logic device characterization using computer-aided test and analysis

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Robert W. Atherton1, Leonard Ekkelkamp2, Chuck Schmitz2•
Incyte1, Fairchild Semiconductor International, Inc.2
16 Oct 1984
TL;DR: DC data for a 32-bit EDAC has been analyzed using a multivariable analysis svstem for exploratory data analysis and provides new insight into device design, performance, and process.
Abstract: Device characterization is performed using computer-aided test and analysis systems. DC data for a 32-bit EDAC has been analyzed using a multivariable analysis svstem for exploratory data analysis. Pin-to-pin variations in the DC parameters are detectable. Multivariate plots establish predictable behavior over temperature ranges. Lot-to-lot variations in test parameters are also detected. This analysis provides new insight into device design. performance, and process.