Showing papers in "Technical report of IEICE. VLD in 2011"

Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA

Abstract: We focus on degradation of FPGAs which has become dominant due to scaling and quanti- tatively estimate the degradation of FPGAs by NBTI. We map ring oscillators on the Cyclone II FPGAs and measure the variation of oscillation frequency. In the result, the variation of oscillation frequency is 2.46%. As for degradation of FPGAs, we measure degradation of oscillation frequency until 10,000 sec- onds passed at room temperature (28 ◦ C), 80 ◦ Ca nd 100 ◦ C. As the result, degradation of oscillation fre- quency increases as temperature increases and degra- dation of about 0.1% at 10,000 seconds is observed at high temperature.