Lcd 패널 상의 불량 검출을 위한 스펙트럴 그래프 이론에 기반한 특성 추출 방법

TLDR: Various features such as brightness features, shape features and statistical features are stated and Bayes classifier using Gaussian mixture model is used as classifier and feature extraction method based on spectral graph theory is presented.

Abstract: For exact classification of the defect, good feature selection and classifier is necessary. In this paper, various features such as brightness features, shape features and statistical features are stated and Bayes classifier using Gaussian mixture model is used as classifier. Also feature extraction method based on spectral graph theory is presented. Experimental result shows that feature extraction method using graph Laplacian result in better performance than the result using PCA.