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Patent

Method of bonding tab inner lead and bonding tool

TLDR
In this article, a TAB tape was used to force the inner lead of the TAB tool to be pressed down into the inner-lead of the inner part of the tape, such that the bonding tool end and inner lead come in close contact with each other.
Abstract
A bonding tool (11a) having a round pointed end (16) smaller than the bonding pad (12) for the semiconductor element (15) is urged with a bonding force F₁ and pressed down into the inner lead (13) of a TAB tape such that the bonding tool end and inner lead come in close contact with each other. Then, the bonding force F₁ applied to the tool is reduced to F₂, while at the same time ultrasonic vibration (17) is applied to the tool, thus effecting bonding of the inner lead to the bonding pad with applied heat and pressure. Unlike the prior art, no bump has to be formed on the bonding pad for the semiconductor element or on an end of the inner lead. It is thus possible to simplify the bonding process and also to reduce the cost of bonding. Further, a highly reliable bond can be realized without causing crack or other damage to the pad structure.

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Citations
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Patent

Semiconductor connection components and methods with releasable lead support

TL;DR: In this paper, a connection component for electrically connecting a semiconductor chip to a support substrate incorporates a preferably dielectric supporting structure defining gaps, and leads extend across these gaps so that the leads are supported on both sides of the gap.
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Connection components with frangible leads and bus

TL;DR: In this article, an electrically conductive leads are adapted to be bonded to contacts on a semiconductor chip by breaking the frangible sections of the leads so as to disconnect the second ends of the leading from the bus and engage the leads with the contacts of the semiconductor.
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TL;DR: In this article, a window pane has a substrate formed from glass and includes an electrical device including an electrical conductor, and an electrical connector is operatively connected to and in electrical communication with the conductor for transferring electrical energy to the conductor.
References
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Patent

Integrated test and assembly device

TL;DR: In this article, a semiconductor integrated circuit device of the beam lead type is presented, which is composed of an interconnection substrate with apertures for integrated circuit chips therein and with metallization patterns having sharply pointed ends for penetrating oxide layers over the bonding pads of the chips and for making electrical connection.
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