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Method of fabrication of a low capacitance self-aligned semiconductor electrode structure

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TLDR
In this paper, the first electrodes are protected by silicon nitride and a low resistivity silicon layer is grown over the semiconductor wafer, forming epitaxial regions over the second electrodes of a polycrystalline region over protected portions of the wafer.
Abstract
Semiconductor electrode structure with low parasitic capacitance and method for forming low capacitance first and second electrodes in a semiconductor device, such as a static induction transistor, while avoiding the requirement for precision mask alignment and mask to mask registration. During formation of electrode contacts, the first electrodes are protected by silicon nitride and a low resistivity silicon layer is grown over the semiconductor wafer, forming epitaxial regions over the second electrodes of a polycrystalline region over protected portions of the wafer. The silicon layer is selectively etched by a mixture which removes the polycrystalline region but does not appreciably affect the epitaxial regions. Second electrode metallic contacts are made in enlarged regions of the second electrodes where mask alignment is not critical. The reduction in contact window overlap by metallic contacts reduces parasitic capacitance.

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Method of making vertical channel field controlled device employing a recessed gate structure

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Symmetric self-aligned processing

TL;DR: In this paper, a method of manufacturing a semiconductor device using simplified processing and eliminating and/or minimizing the extrinsic parasitic elements of the device is presented. But, the method is particularly suited for manufacturing heterojunction bipolar transistors where the extrinic parasitic base resistance and the intrinsic base-collector and base-emitter capacitances can be virtually eliminated and the base contact resistance can be greatly reduced.
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Method of manufacturing heterojunction transistors with self-aligned metal contacts

TL;DR: In this paper, a self-aligned contacts are formed to the base and emitter regions using the lateral overhang portions which provide separation between the emitter structure and the contacts to the Base layer.
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Method of making junction field effect transistor of static induction type

TL;DR: In this paper, an epitaxial layer of high resistivity N-type silicon is grown on a substrate of low resistivity silicon and the remaining silicon nitride is removed, and metal contacts are applied to the gate ridges, the source ridges and the substrate.
References
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Patent

Field effect transistor having a linear attenuation characteristic and an improved distortion factor with multiple gate drain contacts

TL;DR: In this paper, a field effect transistor with two electrodes and distributed resistance there between is described as an attenuator when a main signal is applied across one drain electrode and a source and a control voltage is applied between a gate and the source.
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Method of manufacturing integrated injection logic semiconductor devices utilizing self-aligned double-diffusion techniques

TL;DR: In this paper, a P type semiconductor layer is formed on an N type semiconducting layer by vapour epitaxial growth technique, an insulating film is formed, and a grid shape first opening is provided through the film.
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Process for forming sloped topography contact areas between polycrystalline silicon and single-crystal silicon

TL;DR: In this paper, a sloped tip of a single crystal silicon material located at the end of a polycrystalline silicon layer and making contact with the single-crystal silicon substrate is described.
Patent

Method for manufacturing junction type field-effect transistors

Kiyoshi Aoki, +1 more
TL;DR: In this article, a gate region is formed by diffusing impurities through openings of different masks, where one portion over which a source electrode extends and the other part over which allows an essential gate function.
Patent

Process for fabricating a vertical static induction device

TL;DR: In this paper, a method of fabricating a vertical static induction semiconductor device comprising depositing a polycrystalline silicon film on a single crystal silicon layer, and forming an insulating film comprised of silicon nitride on the poly crystal silicon film is presented.