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Pretreatment liquid of electroless plating onto semiconductor wafer, electroless plating method, and semiconductor device

Ito Junichi
TLDR
In this paper, the authors proposed a pretreatment liquid for electroless plating of nickel or an nickel alloy onto a semiconductor wafer in which n-type and p-type semiconductors are mixed.
Abstract
PROBLEM TO BE SOLVED: To provide a pretreatment liquid for performing electroless plating of nickel or an nickel alloy onto a semiconductor wafer in which n-type and p-type semiconductors are mixed.SOLUTION: The pretreatment liquid of electroless plating is an aqueous solution composed of hydrogen peroxide water, ammonia water and/or tetramethyl ammonium hydroxide (TMAH). When transistor electrodes in which n-type and p-type semiconductors are mixed such as a source and drain electrodes of FET are formed, impurities on a surface of a silicon substrate can be effectively removed or reduced and the surface of the silicon substrate can be activated with the use of the pretreatment liquid of electroless plating. When n-type and p-type semiconductors are mixed in such a silicon substrate, after treatment by the liquid is performed, the pretreatment liquid is adaptable to a subsequent electroless Ni or Ni alloy plating, and thus uniform electroless plating can be performed.

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Citations
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TL;DR: In this article, a mask is formed selectively on a crystalline silicon film containing a catalyst element, and an amorphous silicon film is formed so as to cover the mask.
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References
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Surface-treating method for silicon wafer

TL;DR: In this paper, the authors proposed a method to stabilize and improve the bonding strength of a nickel coating film by successive processes of dipping a wafer in a basic solution and dipping it in a water solution for preplating treatment containing hydrofluoric acid, nitric acid and a compound producing oxygen in the water solution, catalyzing the wafer, and electrolessly plating it with nickel.
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Semiconductor and its manufacturing method

TL;DR: In this article, the problem of suppressing the breaking of a silicide film at a part of a p-n junction in a semiconductor device of a dual-gate structure has been addressed.
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