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Solid-state image pickup apparatus having a defect detecting mode

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TLDR
In this article, a solid-state image pickup apparatus for use as a video camera has a defect detecting mode and an operation mode, which includes a solid state image sensor having pixels arranged in rows and columns for producing an output signal representing a detected image.
Abstract
A solid-state image pickup apparatus for use as a video camera has a defect detecting mode and an operation mode The solid-state image pickup apparatus includes a solid-state image sensor having pixels arranged in rows and columns for producing an output signal representing a detected image The solid-state image sensor operates in a field reading mode for reading electric charges from the pixels in approximately one field period such that the electric charges of the pixels of two adjacent rows are summed before being outputted from the solid-state image sensor, the summed electric charges being different in even- and odd-numbered fields, and also operates in a frame reading mode for reading electric charges from the pixels in approximately one frame period such that the electric charges of the pixels of one of two vertically adjacent rows are read in even-numbered fields and the electric charges of the pixels of the other of two adjacent rows are read in odd-numbered fields The positions of defective pixels of the solid-state image sensor are detected in the defect detecting mode, the defective pixels causing noise in the output signal at corresponding times in sampled data of the output signal The detected positions of the defective pixels are stored in a memory When the defect detecting mode is selected, the solid-state image sensor is controlled to operate in the frame reading mode

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Citations
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TL;DR: In this paper, the authors present methods of manufacturing a digital apparatus having compensation for defective pixels, where the compensation circuitry compensates the digital data representative of the image using the information indicative of the locations of the defective pixels.
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References
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Patent

Dark current and defective pixel correction apparatus

TL;DR: In this article, a dark current correction scheme was proposed to eliminate the dark current signal component or components from an output signal of an imaging device having an array of pixels by using an A/D converter and a memory for storing level data of the digitized signal.
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An image defect correcting circuit for a solid state imager

TL;DR: In this article, an image defect correcting circuit for a solid state imager is arranged such that levels of output signals of pixels of a solid-state image pickup element (51R, 51G, 51B) illuminated on its whole surface with a light of uniform brightness are compared with a predetermined level, data indicative of a position of a pixel which outputs a signal of peculiar level is generated on the basis of the compared result.
Patent

Pixel defect correction apparatus

TL;DR: In this paper, a failure correction circuit includes a memory having information of image failure of a solid state imaging device, a coincidence detection circuit for detecting a position of pixel having a failure at the time of image pick up, and a failurerection circuit.
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Temperature tracking defect corrector for a solid-state imager

TL;DR: In this article, a defect corrector for a solid-state imager in which temperature tracking defect correction signals associated with the defective pixels are generated is presented. And the defect correction signal is combined with photoresponse signals from the corresponding defective pixels to provide defect compensation.
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Circuit and method for normalizing detector circuit

TL;DR: In this article, a dynamic detector normalization circuit for normalizing detector output data using detector-error-correcting offset and gain coefficients that are updated in real-time is presented, where the offset/gain coefficients are computed by a coefficient processor at selected update intervals based on detector responses to a reference source.