Showing papers on "Test card published in 2007"

Device and method for realizing border-scanning multi-link test

Abstract: This invention discloses multi-link testing devices and methods which can realize boundary scan. Including: PC module, boundary-scan test card and boundary scan card expansion card; described boundary-scan extended card composed by boundary scan expansion modules , used in a number of boundary-scan test link, through analytical sent from the PC port choice test configuration, boundary scan port expansion card on the number of boundary scan link together into a new boundary scan link , for testing. The invention through the boundary-scan test device provide to PC users easy-to-use interface, test vector generation and the analysis of test data, through PC hardware and procedures rapidly with good boundary-scan test and link extension, chains expansion is easy and convenient flexible scanning, reduced the frequency of chains replacement and increase test coverage and achieve program simple, economical and practical.

Transmission type film test card for camera test and its usage method

Abstract: The invention discloses a penetrance type filling test piece to test cam and using method, which is characterized by the following: setting the surface of the test piece as cell; arranging several concentric circles on the background; arranging digital scale on crosswise and diagonal direction; setting the center of positioning point as the center of concentric circle. This invention can finish above two optical experiments one time.

Test card and test device

Abstract: The utility model relates to a test card and a test set, applied to test the interface card, the test card is inserted into the first slot of a motherboard and connected with the motherboard and a testing interface card through the electric property, thereby testing the working of the interface card through a measuring instrument, the test card comprises a circuit wafer, a faucet arranged in the circuit wafer, a second slot and a plurality of nodes, the faucet is applied to insert into the first slot, the second slot is applied to connect the interface card and the faucet, and a plurality of nodes are respectively connected with the appointed signal of the faucet and the second slot, and didymously connected with the electric property through the electric lead, to applied to the measuring instrument directly tests the working of the interface card through the electric lead. Moreover, the utility model also provides a measuring instrument with the test card.

Matching between telemetric measures and images for mobile robotics

Abstract: Mobile robotics often uses both cameras and range finders for applications like environment perception. In this paper, we propose a method to calibrate such sensors to be able to match their respective informations. To do that, we present to the camera and to the rangefinder a test card in several different positions. Once we know the position of this test card in both reference frames of the camera and the rangefinder, we are able to determine the position and orientation of the rangefinder wrt. the camera. Then, we project some laser points from the rangefinder to the image plane of the camera to determine the system precision.

Klippon card tester

Abstract: A klippon card tester is provided to inform a user of a replacement time of the klippon card by analyzing a variation of a test result of the klippon card. A fine voltage supply(10) supplies a DC voltage and a fine step voltage for measuring operation voltages of a klippon card and a coil. A test card mount(40) receives the voltage from the fine voltage supply and activates the klippon card to be tested. An analog processor(20) and a digital processor(30) process analog signals, digital signals, and AC frequency inputs for measuring the contact node operation time of the klippon card. An industrial computer(50) stores digital outputs from the analog and digital processors on a database, and calculates and stores a coil resistance, an operation voltage, a contact node operation time, and a variation of test results. A monitor/printer(60) displays and prints out the results from the industrial computer.

Display card testing method for embedded system

Abstract: The invention relates to a test method of display card of face embedded system, wherein said method comprises: initializing the test that obtaining the document describe mark of test console, judging if needs to switch said test console, setting port I/O priority and changing I/O priority level, initializing LRMI and setting present mode as diagram mode; storing present VESA FrameBuffer state; setting test display mode; drawing the test diagram of test card; recovering present VESA diagram FrameBuffer state. The invention has low demands on the time and space of test condition, without loading Xlib to complete the test of display card under Linux.