A
Ady Levy
Researcher at KLA-Tencor
Publications - 79
Citations - 3097
Ady Levy is an academic researcher from KLA-Tencor. The author has contributed to research in topics: Metrology & Wafer. The author has an hindex of 27, co-authored 79 publications receiving 3093 citations.
Papers
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Patent
Apparatus and methods for detecting overlay errors using scatterometry
Walter D. Mieher,Ady Levy,Boris Golovanesky,Michael Friedmann,Ian Smith,Michael E. Adel,Anatoly Fabrikant +6 more
TL;DR: In this article, a scatterometry overlay technique is used to analyze the measured optical signals of the periodic targets and the predefined offsets of the first and second structures of the targets to determine an overlay error between the first-and second-layer structures.
Patent
Methods and systems for determining a critical dimension and overlay of a specimen
Ady Levy,Kyle A. Brown,Rodney Smedt,Gary Bultman,Mehrdad Nikoonahad,Dan Wack,John Fielden,Ibrahim Abdulhalim +7 more
Patent
Overlay marks, methods of overlay mark design and methods of overlay measurements
TL;DR: In this article, an overlay mark for determining the relative shift between two or more successive layers of a substrate is disclosed, which includes at least one test pattern including a first and a second layer of the substrate in a first direction and at least two working zones diagonally opposed and spatially offset relative to one another.
Patent
Method for determining lithographic focus and exposure
TL;DR: In this paper, a method for determining one or more process parameter settings of a photolithographic system is described, which is used to determine the optimal configuration of the photolithography system.