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Akio Hiraki

Researcher at Osaka University

Publications -  173
Citations -  3010

Akio Hiraki is an academic researcher from Osaka University. The author has contributed to research in topics: Diamond & Chemical vapor deposition. The author has an hindex of 28, co-authored 173 publications receiving 2978 citations.

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Low temperature reactions at Si/metal interfaces; What is going on at the interfaces?

TL;DR: In this paper, the Coulomb interaction was proposed as a possible mechanism of the bond-weakening in Si-LSI interfaces, which is based on the channeling effect of MeV He + ions.
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Formation of SiH bonds on the surface of microcrystalline silicon covered with SiOx by HF treatment

TL;DR: In this paper, the surface chemical bonds on microcrystalline silicon (μ c -Si) were investigated with recycling procedures of thermal oxygenation accompanied with dehydrogenation and HF etching.
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Large area chemical vapour deposition of diamond particles and films using magneto-microwave plasma

TL;DR: In this paper, a large area chemical vapour deposition of diamond has been obtained using magneto-microwave plasma, where the important point of the developed system is to set the electron cyclotron resonance condition (875 G), where the highest plasma density is expected, at the deposition area by controlling the distribution of an applied magnetic field.
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Excitonic recombination radiation in undoped and boron-doped chemical-vapor-deposited diamonds.

TL;DR: In moderately doped semiconducting diamonds, the intensity ratio between bound- Exciton and free-exciton recombination reflects the boron concentration in the films, indicating the possibility for a measure of the acceptor concentration in semiconducted diamond.
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Presence of critical Au-Film thickness for room temperature interfacial reaction between Au(film) and Si(crystal substrate)

TL;DR: In this article, the authors studied the room temperature interfacial reaction between Au(film) and Si(crystal substrate) as a function of Au-film thickness by ELS, AES and LEED under slow deposition condition (∼ 0.1 monolayer min−1) at ultra high vacuum.