A system of Flash EEprom memory chips with controlling circuits serves as non-volatile memory such as that provided by magnetic disk drives. Improvements include selective multiple sector erase, in which any combinations of Flash sectors may be erased together. Selective sectors among the selected combination may also be de-selected during the erase operation. Another improvement is the ability to remap and replace defective cells with substitute cells. The remapping is performed automatically as soon as a defective cell is detected. When the number of defects in a Flash sector becomes large, the whole sector is remapped. Yet another improvement is the use of a write cache to reduce the number of writes to the Flash EEprom memory, thereby minimizing the stress to the device from undergoing too many write/erase cycling.

Flash EEprom system

Structures, methods of manufacturing and methods of use of electrically programmable read only memories (EPROM) and flash electrically erasable and programmable read only memories (EEPROM) include split channel and other cell configurations. An arrangement of elements and cooperative processes of manufacture provide self-alignment of the elements. An intelligent programming technique allows each memory cell to store more than the usual one bit of information. An intelligent erase algorithm prolongs the useful life of the memory cells. Use of these various features provides a memory having a very high storage density and a long life, making it particularly useful as a solid state memory in place of magnetic disk storage devices in computer systems.

Highly compact EPROM and flash EEPROM devices

A mass storage system made of flash electrically erasable and programmable read only memory (“EEPROM”) cells organized into blocks, the blocks in turn being grouped into memory banks, is managed to even out the numbers of erase and rewrite cycles experienced by the memory banks in order to extend the service lifetime of the memory system. Since this type of memory cell becomes unusable after a finite number of erase and rewrite cycles, although in the tens of thousands of cycles, uneven use of the memory banks is avoided so that the entire memory does not become inoperative because one of its banks has reached its end of life while others of the banks are little used. Relative use of the memory banks is monitored and, in response to detection of uneven use, have their physical addresses periodically swapped for each other in order to even out their use over the lifetime of the memory.

Wear leveling techniques for flash EEPROM systems

A menu driven reprogrammable drug pump is provided with a memory, such as flash memory, a display, a keyboard, and a communications port to allow a generic pump to be programmed with a desired pump application (therapy) program and patient specific settings. Programming and data transfer with another pump or a computer to and from the patient pump is by the communications port that allows local and/or remote communications with the pump. Flash memory stores the pump application program during use. Patient safety is provided by a cassette identification system, an occlusion detection system, and a latch/lock detection system. Automated testing of the pump is by a closed loop testing system.

Drug pump systems and methods

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulative drift becomes so severe that it develops into a hard error. Data could be lost if enough of these hard errors swamps available error correction codes in the memory. A memory device and techniques therefor are capable of detecting these drifts and substantially maintaining the threshold voltage of each memory cell to its intended level throughout the use of the memory device, thereby resisting the development of soft errors into hard errors.

Soft Errors Handling in EEPROM Devices

A semiconductor flash EPROM/EEPROM device which includes a command port for receiving instruction on a data line and providing control signals to a memory for providing program and erase functions, a method to program and erase the memory. A program sequence is comprised of setting up a program command during a first write cycle, preforming a second write cycle to load address to address register and data to to a data register, programming during a program cycle and writing a program verify command during a third write cycle to verify the programmed data during a read cycle. An erase sequence is comprised of writing a setup erase command during a first write cycle, an erase command during a second write cycle providing the erasure during an erase cycle, writing the erase verify command during a third write cycle which also addresses the address of the memory and providing erase verification during a read cycle. Both the erase and program cycles provide for measured incremental erasing and programming.

Program/erase selection for flash memory

A semiconductor flash EPROM/EEPROM device which includes a command port controller for receiving command instructions from a data bus coupled to the memory device. Instruction words to a command port controller operates to instruct the device to perform read, erase, program, or verify functions and the command port controller generates necessary control signals to cause the memory to function appropriately. By utilizing the command port controller the memory device can be erased and programmed while the device is in the circuit and permits pin compatibility with the prior art EPROM and EEPROMs.

Processor controlled command port architecture for flash memory

A method and apparatus suspend a program operation in a nonvolatile writeable memory. The nonvolatile writeable memory includes a memory array, a command register, and memory array control circuitry. The command register decodes a program suspend command and provides a suspend signal as an output. The memory array control circuitry is coupled to receive the suspend signal from the command register. The memory array control circuitry performs a program operation in which data is written to the memory array. The memory array control circuitry suspends the program operation upon receiving the suspend signal.

Method and apparatus for suspending the writing of a nonvolatile semiconductor memory with program suspend command

The authors describe the design and performance of a 192-mil/sup 2/ 256 K (32 K*8) flash memory targeted for in-system reprogrammable applications. Developed from a 1.5 mu m EPROM base technology with a one-transistor 6*6- mu m/sup 2/ cell, the device electrically erases all cells in the array matrix in 200 ms and electrically programs at the rate of 100 mu s/byte typical. The read performance is equivalent to comparable-density CMOS EPROM devices with a chip-enable access time of 110 ns at 30-mA active current consumption. A command-port interface facilitates microprocessor-controlled reprogramming capability. Device reliability has been increased over byte-alterable EEPROMs by reducing the program power supply to 12 V. Cycling endurance experiments have demonstrated that the device is capable of more than 10000 erase/program cycles. >

An in-system reprogrammable 32 K*8 CMOS flash memory

A circuit is disclosed for preventing the erasing and programming of a nonvolatile memory device during power up and power down transitions. A power supply generator incorporating an n-channel device and a w-channel device in a wired-or configuration is coupled to a programming voltage Vpp and to a circuit voltage Vcc, and generates a node voltage Vpwr which is the greater of Vpp-Vtn and Vcc-Vtw. Vtn is the gate threshold voltage of the n-channel device, while Vtw is the gate threshold voltage of the w-channel device. The node voltage Vpwr is coupled to a reference voltage generator which provides a reference voltage, a protecting voltage, and a biasing voltage for a Vcc comparator and a Vpp comparator. The Vcc comparator and the Vpp comparator compare Vref with the output of a Vcc divide-by-two circuit and a Vpp divide-by-five cirucit, respectively. Thus, during the power up transition of the nonvolatile memory device where over-erasing may damage the memory array, the circuit forces the nonvolatile memory device into read mode, ensuring that no damaging voltage reaches the memory array. During the power down transition of a nonvolatile memory device where over-programming may accidentally erase the content of the memory array, the circuit forces the nonvolatile memory device into read mode, ensuring that the nonvolatile memory is always in a known state, and thus one can read the memory array. As such, the use of the preferred embodiment of the present invention obviates the prior art power up and power down sequencing and also affords greater protection against accidental erasure and programming than the prior art lockout detection circuit.

Alan Baker

Papers

Program/erase selection for flash memory

Processor controlled command port architecture for flash memory

Method and apparatus for suspending the writing of a nonvolatile semiconductor memory with program suspend command

An in-system reprogrammable 32 K*8 CMOS flash memory

Method and apparatus for preventing the erasure and programming of a nonvolatile memory