A
Alan Gallagher
Researcher at National Institute of Standards and Technology
Publications - 182
Citations - 7636
Alan Gallagher is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Silane & Excited state. The author has an hindex of 46, co-authored 182 publications receiving 7483 citations. Previous affiliations of Alan Gallagher include JILA & Joint Institute for Nuclear Research.
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Nonexponential “blinking” kinetics of single CdSe quantum dots: A universal power law behavior
TL;DR: In this paper, the authors used single molecule confocal microscopy to study fluorescence intermittency of individual ZnS overcoated CdSe quantum dots (QDs) excited at 488 nm.
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``On''/``off'' fluorescence intermittency of single semiconductor quantum dots
TL;DR: In this paper, a single molecule confocal microscopy is used to investigate the detailed kinetics of fluorescence intermittency in colloidal II-VI (CdSe) semiconductor quantum dots.
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Modeling distributed kinetics in isolated semiconductor quantum dots
Masaru Kuno,D P. Fromm,D P. Fromm,S T. Johnson,S T. Johnson,Alan Gallagher,Alan Gallagher,David J. Nesbitt,David J. Nesbitt +8 more
TL;DR: In this paper, a detailed modeling of recently observed nonexponential fluorescence intermittency in colloidal semiconductor quantum dots (QDs) is presented, where several models are considered and tested against their ability to predict inverse power law behavior in both on-time and off-time probability densities generated from single-QD fluorescence trajectories.
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Extreme-Wing Line Broadening and Cs-Inert-Gas Potentials
TL;DR: In this article, the authors used the quasistatic theory of line broadening, extended to include the distribution of perturber positions about the Cs*, to analyze the emission profiles of the cesium resonance lines broadened by collisions with inert gases.
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Total and partial electron collisional ionization cross sections for CH4, C2H6, SiH4, and Si2H6
TL;DR: The total and partial electron collisional ionization cross sections for CH4, C2H6, SiH4, and SiH6 have been measured for electron energies from threshold to 300 eV.