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Alexander S. Ditter

Researcher at University of Washington

Publications -  18
Citations -  305

Alexander S. Ditter is an academic researcher from University of Washington. The author has contributed to research in topics: Spectrometer & Synchrotron. The author has an hindex of 11, co-authored 16 publications receiving 251 citations. Previous affiliations of Alexander S. Ditter include Los Alamos National Laboratory.

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An improved laboratory-based x-ray absorption fine structure and x-ray emission spectrometer for analytical applications in materials chemistry research

TL;DR: The design and performance of an improved XAFS and XES spectrometer based on the general conceptual design of Seidler et al. are reported, which enables a new class of routine applications that are incompatible with the mission and access model of the synchrotron light sources.
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The coordination chemistry of CmIII, AmIII, and AcIII in nitrate solutions: an actinide L3-edge EXAFS study

TL;DR: CmIII, AmIII, and AcIII have been characterized by solution L3-edge X-ray absorption spectroscopy as a function of nitric acid concentration and this enabled the first experimental determination of Cm and Ac nitrate distances.
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A Compact Dispersive Refocusing Rowland Circle X-ray Emission Spectrometer for Laboratory, Synchrotron, and XFEL Applications

TL;DR: In this article, the authors present details of the design and performance of a compact x-ray emission spectrometer that uses a dispersive refocusing Rowland (DRR) circle geometry to achieve excellent performance for the 2 - 2.5 keV energy range.
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A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

TL;DR: Details are presented of the design and performance of a compact x-ray emission spectrometer that uses a dispersive refocusing Rowland (DRR) circle geometry to achieve excellent performance for the 2-2.5 keV range, especially for the K-edge emission from sulfur and phosphorous.
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Vacuum formed temporary spherically and toroidally bent crystal analyzers for x-ray absorption and x-ray emission spectroscopy.

TL;DR: It is demonstrated that vacuum forming of 10-cm diameter silicon wafers of various crystallographic orientations under an x-ray permeable, flexible window can easily generate spherically bent crystal analyzezers and toroidally bent crystal analyzers with ∼1-eV energy resolution and a 1-m major radius of curvature.