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Andrew DeOrio

Researcher at University of Michigan

Publications -  28
Citations -  1178

Andrew DeOrio is an academic researcher from University of Michigan. The author has contributed to research in topics: Network on a chip & Debugging. The author has an hindex of 15, co-authored 27 publications receiving 1130 citations.

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Proceedings ArticleDOI

A highly resilient routing algorithm for fault-tolerant NoCs

TL;DR: This work presents a network-on-chip (NoC) routing algorithm to boost the robustness in interconnect networks, by reconfiguring them to avoid faulty components while maintaining connectivity and correct operation.
Proceedings ArticleDOI

Vicis: a reliable network for unreliable silicon

TL;DR: This work presents Vicis, an ElastIC-style NoC that can tolerate the loss of many network components due to wearout induced hard faults, and shows that with stuck-at fault rates as high as 1 in 2000 gates, Vicis will continue to operate with approximately half of its routers still functional and communicating.
Proceedings ArticleDOI

ARIADNE: Agnostic Reconfiguration in a Disconnected Network Environment

TL;DR: A distributed reconfiguration solution named Ariadne, targeting large, aggressively scaled, unreliable NoCs, which provides a 40%-140% latency improvement over other on-chip state-of-the-art fault tolerant solutions, while meeting the low area budget of on- chip routers with an overhead of just 1.97%.
Proceedings ArticleDOI

Event-driven gate-level simulation with GP-GPUs

TL;DR: This work proposes the first event driven logic simulator accelerated by a parallel, general purpose graphics processor (GPGPU), and leverages a gate level event driven design to exploit the benefits of the low switching activity that is typical of large hardware designs.
Journal ArticleDOI

A Reliable Routing Architecture and Algorithm for NoCs

TL;DR: Vicis is a fault-tolerant architecture and companion routing protocol that is robust to a large number of permanent failures, allowing communication to continue in the face of permanent transistor failures.