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Arun Virupaksha Gowda

Researcher at General Electric

Publications -  84
Citations -  1196

Arun Virupaksha Gowda is an academic researcher from General Electric. The author has contributed to research in topics: Layer (electronics) & Power module. The author has an hindex of 20, co-authored 82 publications receiving 1123 citations. Previous affiliations of Arun Virupaksha Gowda include Binghamton University.

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Patent

Thermally conductive composition and method for preparing the same

TL;DR: In this paper, a thermally conductive composition containing spherical boron nitride filler particles having an average aspect ration of less than 20 in a polymer matrix is presented, which is similar to our composition.
Patent

Thermally conductive compositions and methods of making thereof

TL;DR: In this paper, the authors provided a method of making and using such a composition, and a method to make and use such a mixture of liquid metal and particulate filler in a volume ratio of about 1:0.4 to 1:10.
Patent

Thin bond-line silicone adhesive composition and method for preparing the same

TL;DR: In this paper, thermal interface compositions (20) contain filler particles possessing a maximum particle size less than 25 microns in diameter blended with a polymer matrix, which enable lower attainable bond line thickness, which decreases in-situ thermal resistances that exist between thermal interface materials and the corresponding mating surfaces.
Patent

Power overlay structure and method of making same

TL;DR: A power overlay (POL) structure includes a POL sub-module as mentioned in this paper, which includes a dielectric layer and a semiconductor device having a top surface attached to the dielectrics layer.
Proceedings ArticleDOI

Reliability testing of silicone-based thermal greases [IC cooling applications]

TL;DR: In this paper, various tests are explored to determine the ability of thermal greases to deliver a reliable thermal interface, utilizing various thermal grease formulations, different TIM layer geometries, and testing conditions.