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Arun Virupaksha Gowda
Researcher at General Electric
Publications - 84
Citations - 1196
Arun Virupaksha Gowda is an academic researcher from General Electric. The author has contributed to research in topics: Layer (electronics) & Power module. The author has an hindex of 20, co-authored 82 publications receiving 1123 citations. Previous affiliations of Arun Virupaksha Gowda include Binghamton University.
Papers
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Patent
Thermally conductive composition and method for preparing the same
Hong Zhong,Sara Naomi Paisner,Arun Virupaksha Gowda,David Richard Esler,Sandeep Tonapi,Jennifer L. David,Paulo Meneghetti,Laurence Maniccia,Paul Joseph Hans,Robert Fortuna,Gregory A. Strosaker,Gregory W. Shaffer,Hollister Victor +12 more
TL;DR: In this paper, a thermally conductive composition containing spherical boron nitride filler particles having an average aspect ration of less than 20 in a polymer matrix is presented, which is similar to our composition.
Patent
Thermally conductive compositions and methods of making thereof
TL;DR: In this paper, the authors provided a method of making and using such a composition, and a method to make and use such a mixture of liquid metal and particulate filler in a volume ratio of about 1:0.4 to 1:10.
Patent
Thin bond-line silicone adhesive composition and method for preparing the same
Sandeep Tonapi,Hong Zhong,Florian Johannes Schattenmann,David Jennifer Lynn,Kimberly Marie Saville,Arun Virupaksha Gowda,David Richard Elser,Ananth Prabhakumar +7 more
TL;DR: In this paper, thermal interface compositions (20) contain filler particles possessing a maximum particle size less than 25 microns in diameter blended with a polymer matrix, which enable lower attainable bond line thickness, which decreases in-situ thermal resistances that exist between thermal interface materials and the corresponding mating surfaces.
Patent
Power overlay structure and method of making same
TL;DR: A power overlay (POL) structure includes a POL sub-module as mentioned in this paper, which includes a dielectric layer and a semiconductor device having a top surface attached to the dielectrics layer.
Proceedings ArticleDOI
Reliability testing of silicone-based thermal greases [IC cooling applications]
Arun Virupaksha Gowda,David Richard Esler,Sara Naomi Paisner,Sandeep Tonapi,K. Nagarkar,Krishnaswami Srihari +5 more
TL;DR: In this paper, various tests are explored to determine the ability of thermal greases to deliver a reliable thermal interface, utilizing various thermal grease formulations, different TIM layer geometries, and testing conditions.