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Ashutosh Kumar Singh
Researcher at Jawaharlal Nehru Centre for Advanced Scientific Research
Publications - 5
Citations - 32
Ashutosh Kumar Singh is an academic researcher from Jawaharlal Nehru Centre for Advanced Scientific Research. The author has contributed to research in topics: Kondo effect & Topological insulator. The author has an hindex of 2, co-authored 5 publications receiving 12 citations.
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An overview on the structural diversity of europium based ternary intermetallics
TL;DR: In this article, the authors discuss about the Eu-based ternary intermetallics with a focus on the crystal structure and structural relationship of Eu based ternaries with known structures and finally novel structure types.
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Rare-earth based half-Heusler topological quantum materials: A perspective
TL;DR: In this article, the authors have briefly discussed the development of structural relations, the quantum hall effect, Landau quantization, and topological properties of representative systems in the half-Heusler family, including methods by which they are studied and characterized.
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Ambient, tunable room temperature phosphorescence from a simple phthalimide phosphor in amorphous polymeric matrix and in crystalline state
TL;DR: In this article, a simple phthalimide phosphor derivative is reported, which exhibits visible cyan emissive phosphorescence in solution-processable thin films and orange-red emitting phosphorescence (RTP) in the crystalline state.
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Electrical transport properties of half-heusler ScPdBi single crystals under extreme conditions
S.D. Ramarao,Amit Pawbake,Ashutosh Kumar Singh,Manuel Núñez-Regueiro,Marie-Aude Méasson,Sebastian C. Peter +5 more
TL;DR: In this article, the authors synthesize single-crystals of ScPdBi, a Half-Heusler compound by self-flux growth technique and report its physical properties such as magneto-transport and specific heat down to 2 K.
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Structure and physical properties of the solid solution Gd2–xNdxPdSi3 (x = 0, 0.75, 1, 2)
TL;DR: In this paper, the structural and magnetic properties of Gd2−xNdxPdSi3 have been studied using X-ray diffraction (XRD), exchange bias and magnetization measurements.