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B. C. Joshi

Researcher at Jaypee Institute of Information Technology

Publications -  16
Citations -  188

B. C. Joshi is an academic researcher from Jaypee Institute of Information Technology. The author has contributed to research in topics: Thin film & Band gap. The author has an hindex of 7, co-authored 16 publications receiving 156 citations. Previous affiliations of B. C. Joshi include Kurukshetra University & Council of Scientific and Industrial Research.

Papers
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Structural, optical and electronic structure studies of Al doped ZnO thin films

TL;DR: In this paper, the structural, optical and electronic structure of Al doped ZnO thin films grown using pulsed laser deposition on glass substrate is investigated and X-ray diffraction measurements reveal that all the films are textured along the c-axis and have wurtzite structure.
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Effect of post annealing temperature on structural and optical properties of ZnCdO thin films deposited by sol–gel method

TL;DR: In this paper, a large number of ZnCdO thin films oriented along c-axis have been successfully deposited on p-Si substrates using sol-gel spin coating route.
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Effect of substrate temperature and oxygen partial pressure on structural and optical properties of Mg doped ZnO thin films

TL;DR: In this article, thin films were deposited on quartz substrate by pulsed laser deposition at different oxygen partial pressures and substrate temperatures, and XRD results revealed that deposited films were textured along c-axis and maintain wurtzite crystalline symmetry.
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Band offset studies in pulse laser deposited Zn1−xCdxO/ZnO hetero-junctions

TL;DR: In this paper, the valence and conduction band offsets of Zn1−xCdxO/ZnO hetero-junctions deposited by pulsed laser deposition technique were estimated by X-ray photoelectron, valence band, and UV-visible spectroscopy.
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Structural and optical properties of Cd and Mg doped zinc oxide thin films deposited by pulsed laser deposition

TL;DR: In this article, the structural and optical properties of the prepared ZnO, Cd:ZnO and Mg:ZNO films were investigated by X-Ray diffraction (XRD), photoluminescence and UV-Vis spectroscopy techniques.