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B. K. Harms

Researcher at Kansas State University

Publications -  8
Citations -  95

B. K. Harms is an academic researcher from Kansas State University. The author has contributed to research in topics: Hadamard transform & Spectrometer. The author has an hindex of 6, co-authored 8 publications receiving 95 citations.

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Journal ArticleDOI

A Fast Spectrum-Recovery Method for Hadamard Transform Spectrometers Having Nonideal Masks

TL;DR: In this article, a computationally inexpensive method for the recovery of spectra from measurements obtained with Hadamard transform spectrometers having nonideal masks is presented, requiring only O(N[log 2N + 2] arithmetic operations.
Journal ArticleDOI

An Efficient Method for Recovering the Optimal Unbiased Linear Spectrum-Estimate from Hadamard Transform Spectrometers Having Nonideal Masks

TL;DR: A spectrum-recovery method is presented which efficiently computes an optimal unbiased linear spectrum-estimate for measurements obtained with Hadamard transform (HT) spectrometers having nonideal masks.
Proceedings ArticleDOI

An introduction to Hadamard spectrometry and the multiplex advantage

TL;DR: In this article, the authors consider a special class of problems in which the dominant noise source in the spectrum measurements is the noise generated in the detector itself and they show that the signal-to-noise ratio of the spectrum estimates can be improved by a multiplexing technique known as Hadamard spectrometry.
Journal ArticleDOI

Implementation problems in Hadamard transform spectrometry

TL;DR: In this paper, a block diagram description of HTS and the spectrum-recovery process is presented and a computer simulation of this model has been developed and can be used to examine the effects of certain nonidealities that may typically be encountered.
Journal ArticleDOI

On the Mean-Square Error of Various Spectrum-Recovery Techniques in Hadamard Transform Spectrometry

TL;DR: In this article, three spectrum-recovery techniques for an HT spectrometer having a nonideal electro-optic mask are considered in terms of the mean-square error (MSE) associated with a given estimate.