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Showing papers by "Baojie Yan published in 1994"


Journal ArticleDOI
TL;DR: In this paper, the delay time of forward current onset from initial electron space charge-limited current to recombination−limited current in aSi:H p−i−n devices was studied as a function of bias voltage, temperature and illumination intensity.
Abstract: The delay time of forward current onset from initial electron space‐charge‐limited current to recombination‐limited current in a‐Si:H p‐i‐n devices was studied as a function of bias voltage, temperature and illumination intensity. The results show that the delay time and the initial electron current are related by a power law, td∝I−γSCLC, where γ is a temperature‐independent constant. The value of γ is sensitive to the device properties such as the thickness of the intrinsic layer and the density of states. For a good quality device with 3.74 μm intrinsic layer, γ=0.70±0.05, while for a thin one deposited in the same conditions, γ changes to 0.99±0.05. A physical interpretation is presented.

3 citations