B
Bart Buijsse
Researcher at FEI Company
Publications - 55
Citations - 818
Bart Buijsse is an academic researcher from FEI Company. The author has contributed to research in topics: Lens (optics) & Diffraction. The author has an hindex of 13, co-authored 53 publications receiving 708 citations. Previous affiliations of Bart Buijsse include Thermo Fisher Scientific.
Papers
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Journal ArticleDOI
Volta potential phase plate for in-focus phase contrast transmission electron microscopy
TL;DR: The Volta phase plate has a long service life and has been used for more than 6 mo without noticeable degradation in performance, and the mechanism underlying the VPP is the same as the one responsible for the degradation over time of the performance of thin-film Zernike phase plates, but in the V PP it is used in a constructive way.
Patent
Compact scanning electron microscope
Mart Petrus Maria Bierhoff,Bart Buijsse,Cornelis Sander Kooijman,Leeuwen Hugo Van,Hendrik Gezinus Tappel,Colin August Sanford,Sander Richard Marie Stoks,Steven Berger,Ben Jacobus Marie Bormans,Koen Arnoldus Wilhelmus Driessen,Johannes Antonius Hendricus Wilhelmus Gerardus Persoon +10 more
TL;DR: In this paper, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and a sample holder is first passed under a vacuum buffer to remove air in the holder.
Patent
Environmental cell for a particle-optical apparatus
TL;DR: In this paper, the authors describe an environmental cell for backscattered electrons or X-rays, which is characterized by a part of the environmental cell that is transparent to secondary radiation.
Journal ArticleDOI
Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopy
Bart Buijsse,Frank M.H.M. van Laarhoven,Andreas K. Schmid,Rossana Cambie,Stefano Cabrini,Jian Jin,Robert M. Glaeser +6 more
TL;DR: A novel design is described for an aperture that blocks a half-plane of the electron diffraction pattern out to a desired scattering angle, and then--except for a narrow support beam--transmits all of the scattered electrons beyond that angle, which is a hybrid between the single-sideband (ssb) aperture and the conventional (i.e. fully open) double-sidebands (dsb).
Patent
Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens
TL;DR: In this paper, it is shown that it is possible to keep constant the focus position of a beam of charged particles, independent of the energy of the particles in the beam, by combining a magnetic lens with an accelerating lens.