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Bart Buijsse

Researcher at FEI Company

Publications -  55
Citations -  818

Bart Buijsse is an academic researcher from FEI Company. The author has contributed to research in topics: Lens (optics) & Diffraction. The author has an hindex of 13, co-authored 53 publications receiving 708 citations. Previous affiliations of Bart Buijsse include Thermo Fisher Scientific.

Papers
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Journal ArticleDOI

Volta potential phase plate for in-focus phase contrast transmission electron microscopy

TL;DR: The Volta phase plate has a long service life and has been used for more than 6 mo without noticeable degradation in performance, and the mechanism underlying the VPP is the same as the one responsible for the degradation over time of the performance of thin-film Zernike phase plates, but in the V PP it is used in a constructive way.
Patent

Compact scanning electron microscope

TL;DR: In this paper, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and a sample holder is first passed under a vacuum buffer to remove air in the holder.
Patent

Environmental cell for a particle-optical apparatus

TL;DR: In this paper, the authors describe an environmental cell for backscattered electrons or X-rays, which is characterized by a part of the environmental cell that is transparent to secondary radiation.
Journal ArticleDOI

Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopy

TL;DR: A novel design is described for an aperture that blocks a half-plane of the electron diffraction pattern out to a desired scattering angle, and then--except for a narrow support beam--transmits all of the scattered electrons beyond that angle, which is a hybrid between the single-sideband (ssb) aperture and the conventional (i.e. fully open) double-sidebands (dsb).
Patent

Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens

TL;DR: In this paper, it is shown that it is possible to keep constant the focus position of a beam of charged particles, independent of the energy of the particles in the beam, by combining a magnetic lens with an accelerating lens.