scispace - formally typeset
B

Bingchu Cai

Researcher at Shanghai Jiao Tong University

Publications -  62
Citations -  1686

Bingchu Cai is an academic researcher from Shanghai Jiao Tong University. The author has contributed to research in topics: Amorphous solid & Electrical resistivity and conductivity. The author has an hindex of 16, co-authored 62 publications receiving 1589 citations.

Papers
More filters
Journal ArticleDOI

Fabrication and performance of MEMS-based piezoelectric power generator for vibration energy harvesting

TL;DR: The investigation shows that the designed MEMS-based energy harvesting device is expected to resonantly operate in low-frequency environmental vibration through tailoring the structure dimension.
Journal ArticleDOI

A MEMS-based piezoelectric power generator array for vibration energy harvesting

TL;DR: A power generator array based on thick-film piezoelectric cantilevers is investigated to improve frequency flexibility and power output and is promising to support networks of ultra-low-power, peer-to-peer, wireless nodes.
Journal ArticleDOI

Effects of si doping on the structural and electrical properties of Ge2Sb2Te5 films for phase change random access memory

TL;DR: In this article, the effects of Si doping on the structural and electrical properties of Ge2Sb2Te5 film are studied in detail, which shows that Si doping may increase the dynamic resistance, which is helpful to writing current reduction of phase-change random access memory.
Journal ArticleDOI

Nitrogen-doped Ge2Sb2Te5 films for nonvolatile memory

TL;DR: In this article, nitrogen-doped Ge2Sb2Te5 (GST) films for nonvolatile memories were prepared by reactive sputtering with a GST alloy target, and the electrical properties of the films were studied by analyzing the optical band gap and the dependence of the resistivity on the annealing temperature.
Journal ArticleDOI

Si doping in Ge2Sb2Te5 film to reduce the writing current of phase change memory

TL;DR: In this article, phase change memory devices in size of several micrometers and with pure Ge2Sb2Te5 (GST), N-doped GST, and Si-Doped GST films were investigated and compared with each other.