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C

C. Kim

Researcher at United States Naval Research Laboratory

Publications -  4
Citations -  260

C. Kim is an academic researcher from United States Naval Research Laboratory. The author has contributed to research in topics: Diffraction & Sputtering. The author has an hindex of 3, co-authored 4 publications receiving 251 citations.

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Nanoindentation study of the mechanical properties of copper‐nickel multilayered thin films

TL;DR: In this article, the mechanical properties of multilayered Cu-Ni thin films with bilayer thicknesses of 1.6-12 nm were investigated by a nanoindentation technique.
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Low-dimension structural properties and microindentation studies of ion-beam-sputtered multilayers of Ag/Al films

TL;DR: In this paper, a low load muhardness indentation technique was used to investigate the mechanical properties of artificially modulated silver/aluminum multilayer films with modulation wavelengths between 1.35 and 21.3 nm and total film thickness of 1 μm.
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Ion-beam-sputtered Cu/Ni and Fe/Ni multilayers

TL;DR: In this article, the observed X-ray intensities of the satellites of the (111) reflection in the case of the Cu/Ni multilayers are in approximate agreement with calculated intensities for 24 A ⩽ λ⩽ 194 A where λ is the wavelength of the multilayer.
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Structural and magnetic properties of Al/Fe multilayers deposited by ion beam sputtering

TL;DR: In this paper, an ion-assisted ion-beam sputtering technique was used for the deposition of multilayers of aluminum and iron using X-ray diffraction at high angles and the lattice parameter was calculated to be 2.94 A.c.