C
Cai Xu
Researcher at Sichuan University
Publications - 18
Citations - 68
Cai Xu is an academic researcher from Sichuan University. The author has contributed to research in topics: Computer science & Moiré pattern. The author has an hindex of 2, co-authored 10 publications receiving 10 citations.
Papers
More filters
Journal ArticleDOI
Spatial-temporal phase unwrapping algorithm for fringe projection profilometry.
TL;DR: In this paper, a generalized spatial-temporal phase unwrapping algorithm (STPUA) is proposed for extracting the absolute phase of the isolated objects with intricate surfaces, which can eliminate thoroughly the order jumps of various temporal phase-unwrapping algorithms (TPUAs), while inheriting the high measuring accuracy of quality-guided phase unwrap algorithms (QGPUAs).
Journal ArticleDOI
Orthogonal modulated computer-generated moiré profilometry
TL;DR: In this article, an orthogonal modulated computer-generated moire profilometry is proposed to estimate the 3D shape of an object using only one deformed composite pattern.
Journal ArticleDOI
Improved computer-generated moiré profilometry with flat image calibration.
TL;DR: In this paper, an improved computer-generated moire profilometry (CGMP) with flat image calibration is proposed, which can effectively suppress the influence of ambient light and ensure the measurement accuracy, even if spectrum aliasing exists.
Journal ArticleDOI
A general phase ambiguity suppression algorithm combining geometric constraints and temporal phase unwrapping
TL;DR: In this paper , a universal algorithm combining geometric constraints phase unwrapping (GCPU) and TPU is proposed to comb out the phase ambiguity, which inherits the complementary advantages of absolute position determination and strong robustness in TPU and GCPU respectively.
Journal ArticleDOI
Computer-generated frequency-carrier moiré profilometry
TL;DR: In this paper, a three-dimensional measurement method based on frequency-carrier computer-generated moire fringe is proposed, where two sinusoidal gratings with π phase difference each other are projected onto the measured object respectively and capturing the corresponding deformed patterns, the AC component of the deformed pattern can be extracted.