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Camden R. Hubbard

Researcher at Oak Ridge National Laboratory

Publications -  185
Citations -  5438

Camden R. Hubbard is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Residual stress & Neutron diffraction. The author has an hindex of 36, co-authored 183 publications receiving 5017 citations. Previous affiliations of Camden R. Hubbard include National Institute of Standards and Technology.

Papers
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RIR - Measurement and Use in Quantitative XRD

TL;DR: The Reference Intensity Ratio (RIR) is a general, instrument-independent constant for use in quantitative phase analysis by the X-ray powder diffraction internal standard method as discussed by the authors, which is known as I/Ic.
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Thermal properties of Ti3SiC2

TL;DR: The thermal properties of polycrystalline Ti3SiC2 in the 25°C-1000°C temperature range determined by Rietveld refinement of high temperature neutron diffraction data, show that at all temperatures, the amplitudes of vibration of the Si atoms are higher than those of the Ti and C atoms as mentioned in this paper.
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Standard X-Ray Diffraction Powder Patterns from The JCPDS Research Associateship

TL;DR: The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards.
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Experimental and Thermodynamic Study of Nonstoichiometry in 〈YBa2Cu3O7‐x〉

TL;DR: In this paper, the dependence of the nonstoichiometry of (YBa{sub 2}Cu{sub 3}O{sub 7 {minus} x}) (solid), studied over 5 orders of magnitude in oxygen pressure and from 573 to 1173 K.
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The reference intensity ratio, I/Ic, for computer simulated powder patterns

TL;DR: The Reference Intensity Ratio, I/Ic (c = corundum) as mentioned in this paper is a scale factor derived from the relative to the absolute/relative intensity scale of powder patterns.