C
Chunchuan Xu
Researcher at University of Connecticut
Publications - 6
Citations - 117
Chunchuan Xu is an academic researcher from University of Connecticut. The author has contributed to research in topics: Dielectric & Power cable. The author has an hindex of 5, co-authored 6 publications receiving 104 citations.
Papers
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Journal ArticleDOI
High frequency properties of shielded power cable - part 1: overview of mechanisms
TL;DR: In this article, the authors provide an overview of the mechanisms of high frequency (HF) loss in shielded power cables and discuss the challenges in the measurements of cable material properties at HF.
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Automatic breakdown voltage measurement of polymer films
TL;DR: In this paper, an automatic breakdown tester for film samples which employs metalized film electrodes has been developed and demonstrated and up to 600 breakdowns have been carried out automatically on capacitor film with a Weibull characteristic breakdown voltage in the range of 5 kV. Breakdown data measured with this system agree with data measured manually using the same test method.
Journal ArticleDOI
High frequency properties of shielded power cable. Part 2: sources of error in measuring shield dielectric properties
Chunchuan Xu,Steven A. Boggs +1 more
TL;DR: In this article, the authors provide a theoretical context for the types of errors that are likely to occur during the measurement of high frequency cable shield properties, and consider a RC dielectric system as it relates to measuring the dielectrics properties of cable shield materials.
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Transient characterization of extreme field conduction in dielectrics
TL;DR: In this article, a transient characterization of conduction through planar dielectric film during a linear ramp voltage to breakdown via the cancellation of displacement current to facilitate the measurement of small resistive currents down to 10ppm level.
Journal ArticleDOI
High frequency properties of shielded power cable. 3. Loss from neutral wire-shield interaction
Chunchuan Xu,Steven A. Boggs +1 more
TL;DR: In this article, the authors describe the phenomenon and the basis for an analytic approximation for this loss, which they then compare with the loss as computed using finite-element analysis, and the mathematical solution for the loss is too complicated to be included here.