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Claudia Wu

Researcher at Harvard University

Publications -  11
Citations -  1855

Claudia Wu is an academic researcher from Harvard University. The author has contributed to research in topics: Laser & Silicon. The author has an hindex of 9, co-authored 11 publications receiving 1753 citations.

Papers
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Journal ArticleDOI

Microstructuring of silicon with femtosecond laser pulses

TL;DR: In this paper, the authors report that silicon surfaces develop an array of sharp conical spikes when irradiated with 500 laser pulses of 100-fs duration, 10kJ/m2 fluence in 500-Torr SF6 or Cl2.
Journal ArticleDOI

Near-unity below-band-gap absorption by microstructured silicon

TL;DR: In this paper, surface microstructuring using laser-chemical etching was used to increase the absorptance of light by silicon to approximately 90% from the near ultraviolet (0.25 μm) to the near infrared (2.5 μm).
Journal ArticleDOI

Femtosecond laser-induced formation of spikes on silicon

TL;DR: In this article, it was shown that silicon surfaces develop arrays of sharp conical spikes when irradiated with 500-fs laser pulses in SF6 and the height of the spikes decreases with increasing pulse duration or decreasing laser fluence, and scales nonlinearly with the average separation between spikes.
Journal ArticleDOI

Visible luminescence from silicon surfaces microstructured in air

TL;DR: In this article, visible luminescence from SiOx formed by microstructuring silicon surfaces with femtosecond laser pulses in air is reported, and the amount of oxygen incorporated into the silicon surface depends on the laser fluence; the peak wavelength of the primary luminance band varies between 540 and 630 nm, depending on the number of laser shots.
Patent

Systems and methods for light absorption and field emission using microstructured silicon

TL;DR: In this paper, a sample containing mainly silicon is microstructured by at least one laser pulse to produce cone-like structures on the exposed surface, which enhances the infrared absorbing and current emission properties of the sample.