C
Colin David Chase
Researcher at Applied Materials
Publications - 1
Citations - 18
Colin David Chase is an academic researcher from Applied Materials. The author has contributed to research in topics: Feature (computer vision). The author has an hindex of 1, co-authored 1 publications receiving 18 citations.
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Advanced roughness metrology
Aviram Tam,Colin David Chase +1 more
TL;DR: In this paper, a non-circular non-linear shape is fitted to the plurality of points on an edge of the feature in the image and a roughness parameter for the feature is computed in response to the respective distances.