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D. Pappalardo

Researcher at STMicroelectronics

Publications -  11
Citations -  692

D. Pappalardo is an academic researcher from STMicroelectronics. The author has contributed to research in topics: Charge pump & Capacitor. The author has an hindex of 7, co-authored 11 publications receiving 643 citations.

Papers
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Journal ArticleDOI

Charge Pump Circuits: An Overview on Design Strategies and Topologies

TL;DR: In this paper, the authors provide a deep understanding of the charge pumps behavior, to present useful models and key parameters and to organically and in details discuss the optimized design strategies, and an overview of the main different topologies is also included.
Journal ArticleDOI

Charge-pump circuits: power-consumption optimization

TL;DR: In this article, an optimized strategy for designing charge pumps with minimum power consumption is presented, which allows designers to define the number of stages that, for a given input, and an output voltage, maximize power efficiency.
Patent

Variable stage charge pump

TL;DR: In this article, a variable charge pump contains several simple simple charge pumps, each with a pumping capacitor and a switching mechanism, coupled to the individual charge pumps so that the different lines in the charge pump can be connected together in a serial mode or parallel mode (or mixed serial and parallel modes).
Journal ArticleDOI

Charge pump with adaptive stages for non-volatile memories

TL;DR: In this paper, a charge pump dynamically modifies the number of stages through a feedback that rearranges the topology of the set capacitor minimising power consumption, and the circuit is discussed analytically and validated through transistor-level simulations by using 0.18μm EEPROM technology.
Patent

Multi-stage charge pump voltage generator with protection of the devices of the charge pump

TL;DR: In this article, a high-voltage output transistor is used to protect low voltage devices of a multi-stage charge pump by preventing the controlled output voltage from undergoing excessively abrupt variations, that could damage the transistors of the last stage of the charge pump.