D
D. Perarnau
Researcher at Centre national de la recherche scientifique
Publications - 5
Citations - 958
D. Perarnau is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Silicon. The author has an hindex of 5, co-authored 5 publications receiving 745 citations.
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Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)
TL;DR: In this article, an XPS study of Ce 3D emission spectra dominated by atomic multiplet effects in core level spectroscopy of rare earth compounds (Ce oxides) was presented.
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An XPS investigation of (La2O3)1‐x (CeO2)2x (ZrO2)2 compounds
TL;DR: In this paper, the microstructures of the LC, LCZ and CZ oxides were investigated by core-level spectroscopy (XPS) has been used to study electronic states (III and (IV) of the Ce 3,d5/2 and Ce 3 d3/2 2.
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XPS and FTIR study of silicon oxynitride thin films
TL;DR: In this paper, a study of the compositions and the chemical environments of silicon, oxygen and nitrogen in these films by using XPS, XAES and FTIR characterization methods is presented.
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Solar preparation of SiOx (x ≈ 1) nanopowders from silicon vaporisation on a ZrO2 pellet. XPS and photoluminescence characterisation
TL;DR: SiO x nanoparticles were prepared by vaporization and condensation of melted silicon droplets put on zirconia pellets in a solar reactor at the focus of a 2kW solar furnace as mentioned in this paper.
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XPS and XPS valence band characterizations of amorphous or polymeric silicon based thin films prepared by PACVD from organosilicon monomers
TL;DR: In this paper, XPS core levels and XPS valence band spectra were recorded on air-exposed or Ar + sputtered surfaces of a-SiC x :H and aSiO x C y :H PECVD thin films prepared from various organosilicon precursors with changing the preparation conditions.