scispace - formally typeset
D

Dagang Miao

Researcher at Industrial Research Institute

Publications -  46
Citations -  753

Dagang Miao is an academic researcher from Industrial Research Institute. The author has contributed to research in topics: Thin film & Fourier transform infrared spectroscopy. The author has an hindex of 13, co-authored 41 publications receiving 534 citations. Previous affiliations of Dagang Miao include Qingdao University & Hong Kong Polytechnic University.

Papers
More filters
Journal ArticleDOI

Highly transparent and infrared reflective AZO/Ag/AZO multilayer film prepared on PET substrate by RF magnetron sputtering

TL;DR: In this article, the authors showed that the high visible transmittance and infrared reflection property of the AZO/Ag/AZO multilayer film makes it a promising candidate for solar films.
Journal ArticleDOI

Infrared reflective properties of AZO/Ag/AZO trilayers prepared by RF magnetron sputtering

TL;DR: The results indicated that the Ag inner layer started forming a continuous film at the thickness of 10nm which was supported by XRD results of the distinct 200 and 220 Ag peaks as mentioned in this paper.
Journal ArticleDOI

Effect of heat treatment on infrared reflection property of Al-doped ZnO films

TL;DR: In this article, an al-doped ZnO (ZnO) films were prepared on glass substrates by radio frequency (RF) magnetron sputtering technology.
Journal ArticleDOI

Characterization of AZO and Ag based films prepared by RF magnetron sputtering

TL;DR: The results indicated that Ag inner layer starts forming a continuous film at the thickness of 10nm and Ag layer presents superior crystallization on AZO substrate than that on glass substrate.
Journal ArticleDOI

Photo-thermal conversion and thermal insulation properties of ZrC coated polyester fabric

TL;DR: In this article, Zirconium carbide (ZrC) films are deposited onto polyester fabric through magnetron sputtering, and the deposited films are then examined by using field scanning electron microscopy and energy dispersive X-ray spectroscopy.