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Dahl Young Khang

Researcher at Yonsei University

Publications -  57
Citations -  3198

Dahl Young Khang is an academic researcher from Yonsei University. The author has contributed to research in topics: Thin film & Isotropic etching. The author has an hindex of 21, co-authored 56 publications receiving 2880 citations. Previous affiliations of Dahl Young Khang include University of Illinois at Urbana–Champaign.

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Asymmetric porous membranes from binary polymer solution by physical gelation induced phase separation

TL;DR: In this paper, phase separation induced by physical gelation was identified as the mechanism responsible for the generation of porous structures in elastomeric polydimethylsiloxane (PDMS) assisted drying of binary polymer solution.
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Experimental investigation on the mechanical buckling of one-dimensional Si nanoribbons with a thickness contrast

TL;DR: In this paper, the buckling of one-dimensional Si nanoribbons with a thickness contrast was investigated, and it was shown that the thinned sections were uniformly buckled, and absorbed a large portion of externally applied strain.
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Correlation between electrical properties and cation distribution in [(NixMn1-x)0.84Cu0.16]3O4 thin films prepared by metal-organic decomposition for microbolometer applications

TL;DR: To obtain negative-temperature-coefficient films with reasonable performance through low enough temperature anneal process, Ni content has been systematically varied, and the film microstructure has been found to depend on the relative amount of Ni and Mn.
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Selective growth of ZnO nanorods by thickness contrast in In-doped ZnO quantum dots seed layer.

TL;DR: The low resistance in air, due to increased amount of chemisorbed oxygen, has been found to be responsible for the inferior sensor performance with non-selectively grown sample.
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Electromechanical stability of buckled thin metal films on elastomer

TL;DR: In this article, a thin capping layer of noble metal was proposed to prevent the oxidation of non-noble metal and experimentally verified it is shown that the enhanced oxidation of grain boundaries that are exposed to air when buckled is responsible for the observed electromechanical stability.