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Daniel J. Dickrell
Researcher at University of Florida
Publications - 22
Citations - 313
Daniel J. Dickrell is an academic researcher from University of Florida. The author has contributed to research in topics: Electrical contacts & Contact resistance. The author has an hindex of 9, co-authored 22 publications receiving 306 citations. Previous affiliations of Daniel J. Dickrell include Sandia National Laboratories.
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Electrical contact resistance degradation of a hot-switched simulated metal MEMS contact.
TL;DR: In this paper, a simulated gold-platinum metal microelectromechanical system contact was hot-switched to determine the sensitivity of the contact resistance degradation to current level and environment, and the mechanism responsible for resistance degradation was found to be arc-induced decomposition of adsorbed surface contaminants.
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Electrical Contact Resistance Degradation of a Hot-Switched Simulated Metal MEMS Contact
TL;DR: In this paper, a simulated gold-platinum metal microelectromechanical system contact was hot-switched to determine the sensitivity of the contact resistance degradation to current level and environment, and the mechanism responsible for resistance degradation was found to be arc-induced decomposition of adsorbed surface contaminants.
Journal ArticleDOI
Nanostructural, electrical, and tribological properties of composite Au–MoS2 coatings
TL;DR: In this article, the tribological properties of cosputtered metal/MoS2 solid lubricant films with low metal content were investigated and the results showed that they are tribologically sound.
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The Evolution of Geometry for a Wearing Circular Cam: Analytical and Computer Simulation With Comparison to Experiment
TL;DR: In this article, the evolution of the geometry of a simple two-dimensional circular cam as a result of wear is studied using three complementary approaches: a closed form analytical expression, a computer simulation, and the development of an experimental apparatus.
Proceedings ArticleDOI
The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts
TL;DR: In this article, a modified nano-indentation apparatus was used to bring electrically-biased gold and platinum surfaces into contact at a load of 100 /spl mu/N. The applied normal force and electrical contact resistance of the contact materials were measured simultaneously.