Sensitive photodetectors that operate at a wavelength of 2 μm are required for applications in sensing and imaging but state-of-the-art devices are severely limited by high dark current density (Jdark). The narrow-bandgap materials required for mid-infrared (2–5 µm) detection are plagued by carrier recombination and band-to-band tunnelling; as a result, detectors must be operated at cryogenic temperatures. HgCdTe is currently the most commonly used materials system for these applications and has achieved Jdark = 3 × 10−4 A cm–2 at a gain of 10 while operating at 125 K. Here, we report the details and results for avalanche photodiodes for 2-μm detection based on a separate absorption, charge, and multiplication design in the AlxIn1–xAsySb1–y materials system. We achieve comparable Jdark between 200–220 K and demonstrate very low excess noise (k ≈ 0.01) and gain >100 at room temperature. Such avalanche photodiodes could prove useful for receivers for eye-safe light imaging, detection and ranging. Highly sensitive avalanche photodiodes that operate at near-infrared wavelengths of up to 2 μm could prove useful for eye-safe light imaging, detection and ranging, and other applications.

Low-noise high-temperature AlInAsSb/GaSb avalanche photodiodes for 2-μm applications

Separate absorption grading charge multiplication avalanche photodiodes (SAGCM APDs) are widely accepted in photon starved optical communication systems due to the presence of large photocurrent gain. In this work, we present a detailed analysis of dark currents of planar-type SAGCM InGaAs–InP APDs with different thicknesses of multiplication layer. The effect of the diffusion process, the generation-recombination process, the tunneling process and the multiplication process on the total leakage current is discussed. A new empirical formula has been established to predict the optimal multiplication layer thickness of SAGCM APDs with dark current limited by generation-recombination at multiplication gain of 8.

InGaAs-InP avalanche photodiodes with dark current limited by generation-recombination.

Increasing reliance on the Internet places greater and greater demands for high-speed optical communication systems. Increasing their data transfer rate allows more data to be transferred over existing links. With optical receivers being essential to all optical links, bandwidth performance of key components in receivers, such as avalanche photodiodes (APDs), must be improved. The APDs rely on In0.53Ga0.47As (grown lattice-matched to InP substrates) to efficiently absorb and detect the optical signals with 1310 or 1550 nm wavelength, the optimal wavelengths of operation for these optical links. Thus developing InP-compatible APDs with high gain-bandwidth product (GBP) is important to the overall effort of increasing optical links’ data transfer rate. Here we demonstrate a novel InGaAs/AlGaAsSb APD, grown on an InP substrate, with a GBP of 424 GHz, the highest value reported for InP-compatible APDs, which is clearly applicable to future optical communication systems at or above 10 Gb/s. The data reported in this article are available from the figshare digital repository (https://dx.doi.org/10.15131/shef.data.3827460.v1).

InGaAs/AlGaAsSb avalanche photodiode with high gain-bandwidth product

An InGaAs/InAlAs Single Photon Avalanche Diode was fabricated and characterized. Leakage current, dark count and photon count measurements were carried out on the devices from 260 to 290 K. Due to better temperature stability of avalanche breakdown in InAlAs, the device breakdown voltage varied by < 0.2 V over the 30 K temperature range studied, which corresponds to a temperature coefficient of breakdown voltage less than 7 mV/K. The single photon detection efficiency achieved in gated mode was 21 and 10% at 260 and 290 K, respectively. However the dark count rates were high due to excessive band-to-band tunneling current in the InAlAs avalanche region.

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1550 nm InGaAs/InAlAs single photon avalanche diode at room temperature

The temperature dependence of dark current and avalanche gain were measured on AlAsSb p-i-n diodes with avalanche region widths of 80 and 230 nm. Measurements at temperatures ranging from 77 to 295 K showed that the dark current decreases rapidly with reducing temperature while avalanche gain exhibits a weak temperature dependence. No measurable band to band tunneling current was observed in the thinner diodes at an electric field of 1.07 MV/cm, corresponding to a bias of 95% of the breakdown voltage. Temperature coefficients of breakdown voltage of 0.95 and 1.47 mV/K were obtained from 80 and 230 nm diodes, respectively. These are significantly lower than a range of semiconductor materials with similar avalanche region widths. Our results demonstrated the potential of using thin AlAsSb avalanche regions to achieve low temperature coefficient of breakdown voltage without suffering from high band to band tunneling current.

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AlAsSb Avalanche Photodiodes With a Sub-mV/K Temperature Coefficient of Breakdown Voltage

Simple analytical expressions for temperature coefficients of breakdown voltage of avalanche photodiodes (APDs) utilizing InP or InAlAs are reported. The work is based on measurements of temperature dependence of avalanche breakdown voltage in a series of InP and InAlAs diodes at temperatures between 20 and 375 K. While avalanche breakdown voltage becomes more temperature sensitive with avalanche region thickness for both materials, the InAlAs diodes are less sensitive to temperature changes compared to InP diodes.

Daniel Swee Guan Ong

Papers

Temperature Dependence of Avalanche Breakdown in InP and InAlAs