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David J. Bergman
Researcher at Tel Aviv University
Publications - 262
Citations - 9021
David J. Bergman is an academic researcher from Tel Aviv University. The author has contributed to research in topics: Dielectric & Magnetic field. The author has an hindex of 37, co-authored 260 publications receiving 8656 citations.
Papers
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Journal ArticleDOI
Surface plasmon amplification by stimulated emission of radiation: quantum generation of coherent surface plasmons in nanosystems.
TL;DR: A quantum generator for surface plasmon quanta is introduced and the phenomenon of surface Plasmon amplification by stimulated emission of radiation (spaser) is considered.
Journal ArticleDOI
Self-similar chain of metal nanospheres as an efficient nanolens.
TL;DR: In this paper, a self-similar linear chain of several metal nanospheres with progressively decreasing sizes and separations is proposed, where the spectral maximum of the enhancement is in the near-ultraviolet region, shifting toward the red region as the separation between the spheres decreases.
Book ChapterDOI
Physical Properties of Macroscopically Inhomogeneous Media
David J. Bergman,David Stroud +1 more
TL;DR: In this article, the authors discuss several composites or granular or porous materials that display inhomogeneity on a macroscopic scale and present a discussion of the effective medium approximation, electrostatic resonances, exact bounds, and analytical properties.
Journal ArticleDOI
Localization versus delocalization of surface plasmons in nanosystems: can one state have both characteristics?
TL;DR: From a partial-differential eigenproblem, without use of dipole approximation, it is shown that the eigenmodes of disordered nanosystems are not universally localized, but can have properties of both localized and delocalized states simultaneously.
Journal ArticleDOI
Critical Behavior of the Complex Dielectric Constant near the Percolation Threshold of a Heterogeneous Material
David J. Bergman,Yoseph Imry +1 more
TL;DR: In this article, the behavior of the effective bulk conductivity and dielectric constant of a heterogeneous mixture of a conducting phase and an insulating phase was analyzed in the vicinity of the percolation threshold.