D
David R. Kingham
Researcher at University of Cambridge
Publications - 14
Citations - 672
David R. Kingham is an academic researcher from University of Cambridge. The author has contributed to research in topics: Field ion microscope & Ionization. The author has an hindex of 9, co-authored 14 publications receiving 602 citations.
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The post-ionization of field evaporated ions: A theoretical explanation of multiple charge states
TL;DR: In this article, the probability of post-ionization of field evaporated ions is predicted as a function of field strength for all elements of interest in field evaporation, based on a physically realistic model potential.
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Post-Ionization of Field-Evaporated Ions
Roger Haydock,David R. Kingham +1 more
TL;DR: In this article, it was shown that the final observed charge state of a field-evaporated ion can be explained by the occurrence of postionization whereby an ion being accelerated away from a metal surface in a strong electric field loses one or more electrons by tunneling into the substrate.
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Field ion energy deficit calculations for liquid metal ion sources
TL;DR: Ionisation distributions of field-ionised ions from liquid metal ion sources are calculated in this paper, where various shapes for the emitter region, a range of currents and electric field strengths at the liquid surface are considered and their effects on the energy deficit distribution of the ions are presented through a numerical calculation for gold and gallium.
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Field ionization theory: A new, analytic, formalism
Roger Haydock,David R. Kingham +1 more
TL;DR: In this article, a new formalism for the calculation of field ionization rate-constants near a model metal surface is derived, and approximate analytic formulae are given for the ionisation rateconstant of an atom as a function of distance from the metal surface, for the total probability of ionization on a single pass through the ionization zone and for the width of the ionized zone.
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Calculations of field ionization in the field ion microscope
TL;DR: The ionization of a gas atom as it occurs in the field ion microscope is discussed in this article, where a wide range of values for the electric field intensity at the metal surface are considered in calculating the ionization occurring both far away from and close to the tip.