D
De Liu
Researcher at Huazhong University of Science and Technology
Publications - 21
Citations - 228
De Liu is an academic researcher from Huazhong University of Science and Technology. The author has contributed to research in topics: Film capacitor & Capacitor. The author has an hindex of 8, co-authored 21 publications receiving 183 citations.
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Journal ArticleDOI
Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss
TL;DR: In this article, effective lifetime prediction model (LPM) was introduced to analyze the lifetime of capacitors in lifetime test, and the analysis methods and steps of each model were put forward.
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Study on Self-Healing and Lifetime Characteristics of Metallized-Film Capacitor Under High Electric Field
TL;DR: In this paper, the authors showed that the self-healing energy is approximately inversely proportional to the square of sheet resistance and the increase of the pressure between layers, and that the lifetime of the capacitors can be extended through excluding or decreasing the interlayer air.
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Lifetime investigation and prediction of metallized polypropylene film capacitors
TL;DR: The results suggest that the predicted data could match well with experimental results, and the lifetime prediction model is presented, which predicts the lifetime under various operational factors based on the experimental results.
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Insulation resistance of metallized polypropylene film capacitors under different electric fields
TL;DR: In this article, the leakage phenomenon in metallized polypropylene film capacitors (MPPFCs) by the measurement and analysis of the insulation resistance (IR) was investigated and the results indicated that the time constant (called equivalent IR) is extremely sensitive to the electric field and IR changes little under electric field lower than 10 V/μm.
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T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics
TL;DR: The fuse design methodology of T pattern segment film is presented and a design case is provided and the fuse burn-out criteria are investigated according to electrical explosion theory and phase transition energy of segment metallized film fuse.