D
Dihu Chen
Researcher at Sun Yat-sen University
Publications - 17
Citations - 153
Dihu Chen is an academic researcher from Sun Yat-sen University. The author has contributed to research in topics: Thin film & Vacuum arc. The author has an hindex of 7, co-authored 17 publications receiving 140 citations. Previous affiliations of Dihu Chen include The Chinese University of Hong Kong.
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Blood compatibility of La2O3 doped diamond-like carbon films
TL;DR: In this paper, a diamond-like carbon film with different concentration of doped La 2 O 3 doped carbon was deposited by using Radio-Frequency magnetron sputtering and the microstructure and surface properties were characterized by Raman spectroscopy, X-ray photoelectron spectroscopic (XPS), and contact angle test.
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Effect of surface microstructure and wettability on plasma protein adsorption to ZnO thin films prepared at different RF powers
TL;DR: The results show that fewer plasma proteins and a smaller HFG/HSA ratio adsorb on the ZnO thin films' surface.
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Preparation and blood compatibility of carbon/TiO2 nanocomposite
TL;DR: In this paper, a carbon/TiO2 nanocomposite, which consists of carbon film with various sp3C content and nanowire arrays, has been synthesized, in which the top surface of TiO2 arrays prepared using hydrothermal method on fluorine-doped tin oxide glass were coated with carbon thin films.
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Influence of bias voltage on morphology and structure of MgO thin films prepared by cathodic vacuum arc deposition
TL;DR: In this article, the influence of negative pulse bias voltage on the composition, morphology and crystal structure of MgO thin films, respectively, was investigated using Rutherford backscattering spectroscopy, atomic force microscopy and X-ray diffraction.
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Structure and blood compatibility of tetrahedral amorphous hydrogenated carbon formed by a magnetic-field-filter plasma stream☆
TL;DR: In this article, Tauc-Lorentz oscillator model was used to calculate the relative sp3 C ratio of each sample using Bruggeman effective medium approximation and then quantified by using electron energy-loss spectroscopy (EELS).