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Dirk Sander

Researcher at Max Planck Society

Publications -  96
Citations -  2211

Dirk Sander is an academic researcher from Max Planck Society. The author has contributed to research in topics: Magnetic anisotropy & Scanning tunneling microscope. The author has an hindex of 26, co-authored 96 publications receiving 2095 citations.

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The magnetic anisotropy and spin reorientation of nanostructures and nanoscale films

TL;DR: In this paper, the magnetic anisotropy of nanometer thin films and of nanosize structures is discussed, and it is shown that film strain and its relaxation give rise to film thickness dependent anisotsropy, which can be misinterpreted as a surface anisotropic.
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Film Stress and Domain Wall Pinning in Sesquilayer Iron Films on W(110).

TL;DR: The magnetism of the sesquilayer films is investigated by in situ Kerr effect measurements; the observed coercivity is explained by a novel domain wall pinning mechanism which is estimated to be 10 times stronger than the stress induced coercivity increase.
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Spin-dependent Quantum Interference within a Single Magnetic Nanostructure

TL;DR: Using spin-polarized scanning tunneling microscopy, it is found that quantum interference of electrons causes spatial modulation of spin polarization within a single magnetic nanostructure.
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Spin-polarized quantum confinement in nanostructures: Scanning tunneling microscopy

TL;DR: In this paper, the role of spin polarization in electron confinement is highlighted by both experimental and theoretical insights, which indicate variation of the spin polarization on the nanometer scale and provide compelling evidence for the necessity to include spatial-dependent spin-resolved electronic properties for an in-depth understanding and quantitative assessment of electron confinement in magnetic nanostructures and interaction between magnetic adatoms.
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Stress and magnetic properties of surfaces and ultrathin films

TL;DR: In this article, the magneto-elastic coupling coefficient B1 of Fe(1/0/0) films was measured directly and a strain-dependent correction of B1 was proposed to explain the apparent thickness dependence of B 1 for films thicker than 10nm.