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Donald E. Schuele

Researcher at Case Western Reserve University

Publications -  43
Citations -  1985

Donald E. Schuele is an academic researcher from Case Western Reserve University. The author has contributed to research in topics: Dielectric & Dielectric loss. The author has an hindex of 24, co-authored 43 publications receiving 1775 citations.

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Reduction of Dielectric Hysteresis in Multilayered Films via Nanoconfinement

TL;DR: In this article, a micro/nanolayer coextrusion was used to fabricate polycarbonate (PC)/polyvinylidene fluoride (PVDF) layered films with significantly reduced dielectric losses while maintaining high energy density.
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Pressure and temperature derivatives of the elastic constants of caF2 and BaF2

TL;DR: In this paper, the elastic constants and their pressure and temperature derivatives were measured by the ultrasonic pulse-echo technique for CaF 2 and BaF 2 at 195° and 298°K.
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Pressure derivatives of the elastic constants of NaCl and KCl at 295°K and 195°K

TL;DR: In this paper, pressure derivatives of the adiabatic elastic constants of NaCl and KC1 have been measured at 295°K and 195°K using the ultrasonic pulse-echo technique.
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Interfacial polarization and layer thickness effect on electrical insulation in multilayered polysulfone/poly(vinylidene fluoride) films

TL;DR: In this paper, layer thickness effect on the electrical insulation property of polysulfone (PSF)/poly(vinylidene fluoride) multilayer films having a fixed composition of PSF/PVDF was studied for 32-and 256-layer films having various total film thickness.
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Low‐frequency dielectric constants of α‐quartz, sapphire, MgF2, and MgO

TL;DR: In this article, the 1000-Hz 300°K dielectric constants were measured for crystalline α-quartz, sapphire, MgF2, and MgO.