D
Donald E. Schuele
Researcher at Case Western Reserve University
Publications - 43
Citations - 1985
Donald E. Schuele is an academic researcher from Case Western Reserve University. The author has contributed to research in topics: Dielectric & Dielectric loss. The author has an hindex of 24, co-authored 43 publications receiving 1775 citations.
Papers
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Journal ArticleDOI
Reduction of Dielectric Hysteresis in Multilayered Films via Nanoconfinement
Matthew Mackey,Donald E. Schuele,Lei Zhu,Lionel Flandin,Mason A. Wolak,James S. Shirk,Anne Hiltner,Eric Baer +7 more
TL;DR: In this article, a micro/nanolayer coextrusion was used to fabricate polycarbonate (PC)/polyvinylidene fluoride (PVDF) layered films with significantly reduced dielectric losses while maintaining high energy density.
Journal ArticleDOI
Pressure and temperature derivatives of the elastic constants of caF2 and BaF2
C. Wong,Donald E. Schuele +1 more
TL;DR: In this paper, the elastic constants and their pressure and temperature derivatives were measured by the ultrasonic pulse-echo technique for CaF 2 and BaF 2 at 195° and 298°K.
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Pressure derivatives of the elastic constants of NaCl and KCl at 295°K and 195°K
R.A. Bartels,Donald E. Schuele +1 more
TL;DR: In this paper, pressure derivatives of the adiabatic elastic constants of NaCl and KC1 have been measured at 295°K and 195°K using the ultrasonic pulse-echo technique.
Journal ArticleDOI
Interfacial polarization and layer thickness effect on electrical insulation in multilayered polysulfone/poly(vinylidene fluoride) films
Jung-Kai Tseng,Saide Tang,Zheng Zhou,Matthew Mackey,Joel Carr,Richard Mu,Lionel Flandin,Donald E. Schuele,Eric Baer,Lei Zhu +9 more
TL;DR: In this paper, layer thickness effect on the electrical insulation property of polysulfone (PSF)/poly(vinylidene fluoride) multilayer films having a fixed composition of PSF/PVDF was studied for 32-and 256-layer films having various total film thickness.
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Low‐frequency dielectric constants of α‐quartz, sapphire, MgF2, and MgO
TL;DR: In this article, the 1000-Hz 300°K dielectric constants were measured for crystalline α-quartz, sapphire, MgF2, and MgO.