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Dongjiang You

Researcher at University of Minnesota

Publications -  9
Citations -  151

Dongjiang You is an academic researcher from University of Minnesota. The author has contributed to research in topics: Test suite & Test case. The author has an hindex of 5, co-authored 9 publications receiving 140 citations. Previous affiliations of Dongjiang You include Nanjing University.

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Proceedings ArticleDOI

Observable modified Condition/Decision coverage

TL;DR: This report combines the MC/DC coverage metric with a notion of observability that helps ensure that the result of a fault encountered when covering a structural obligation propagates to a monitored variable; it is hypothesized this path requirement will make structural coverage metrics more effective at revealing faults and more robust to changes in program structure.
Proceedings ArticleDOI

A Simulation Study on Some Search Algorithms for Regression Test Case Prioritization

TL;DR: A simulation experiment is performed to study five search algorithms for test case prioritization and compare the performance of these algorithms, finding two search algorithms, Additional Greedy Algorithm and 2-Optimal GreedyAlgorithm, outperform the other three search algorithms in most cases.
Proceedings ArticleDOI

An empirical study on the effectiveness of time-aware test case prioritization techniques

TL;DR: Although the techniques considering the time cost of each test case are slightly better than the techniques not considering such information in some cases, they have no significant difference in most cases.
Book ChapterDOI

Are We There Yet? Determining the Adequacy of Formalized Requirements and Test Suites

TL;DR: The results of the preliminary study show that even for systems with comprehensive test suites and good sets of requirements, the approach can identify cases where more tests or more requirements are needed to improve coverage numbers.
Proceedings ArticleDOI

Efficient observability-based test generation by dynamic symbolic execution

TL;DR: This study proposes an incremental test generation approach that combines the notion of observability with dynamic symbolic execution and shows that the incremental approach requires much lower generation time, while achieving even higher fault finding effectiveness compared with regular OMC/DC generation.