D
Dries Vanoost
Researcher at Katholieke Universiteit Leuven
Publications - 62
Citations - 309
Dries Vanoost is an academic researcher from Katholieke Universiteit Leuven. The author has contributed to research in topics: Computer science & Error detection and correction. The author has an hindex of 9, co-authored 45 publications receiving 169 citations.
Papers
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Journal ArticleDOI
Magnetic hysteresis at the domain scale of a multi-scale material model for magneto-elastic behaviour
Dries Vanoost,Simon Steentjes,Joan Peuteman,Georges Gielen,H. De Gersem,H. De Gersem,Davy Pissoort,Kay Hameyer +7 more
TL;DR: In this paper, a multi-scale energy-based material model for poly-crystalline materials is proposed to account for the heterogeneity and multi-axiality of the material behavior.
Proceedings ArticleDOI
Effectiveness of Hamming Single Error Correction Codes Under Harsh Electromagnetic Disturbances
Jonas Van Waes,Jonas Lannoo,Jens Vankeirsbilck,Andy Degraeve,Joan Peuteman,Dries Vanoost,Davy Pissoort,Jeroen Boydens +7 more
TL;DR: The effectiveness of the Hamming code is evaluated under harsh electromagnetic disturbances and simulations show that, under certain conditions, the impact of the introduced overhead cannot be compensated by the single error correcting capabilities of theHamming codes.
Proceedings ArticleDOI
Effectiveness of Time Diversity to Obtain EMI-Diverse Redundant Systems
TL;DR: In a majority voting (2oo3) system it is possible to eliminate all triple occuring faults and the time diversity method performs well (better than other EMI-diverse techniques).
Proceedings ArticleDOI
Effectiveness of inversion diversity to cope with EMI within a two-channel redundant system
TL;DR: The effectiveness of inversion diversity to cope with EM disturbances caused by strong incident fields under reverberation room conditions is studied and it is shown that with increasing distance between the two traces, the probability on false positive increases.
Proceedings ArticleDOI
Effectiveness of Cyclic Redundancy Checks under harsh electromagnetic disturbances
TL;DR: This paper shows that, at specific bit and disturbance frequencies, CRC can generate false positives, and a formula to predict those is presented and techniques to overcome this downside are provided.