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Emil Gizdarski
Researcher at Synopsys
Publications - 24
Citations - 469
Emil Gizdarski is an academic researcher from Synopsys. The author has contributed to research in topics: Scan chain & Automatic test pattern generation. The author has an hindex of 10, co-authored 24 publications receiving 445 citations.
Papers
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Proceedings ArticleDOI
A reconfigurable shared scan-in architecture
Samitha Samaranayake,Emil Gizdarski,Nodari Sitchinava,Frederic J. Neuveux,Rohit Kapur,T.W. Williams +5 more
TL;DR: An efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic scan) architecture is defined and the results demonstrate the efficiency of the proposed architecture for real-industrial circuits.
Proceedings ArticleDOI
Changing the scan enable during shift
Nodari Sitchinava,Emil Gizdarski,Samitha Samaranayake,Frederic J. Neuveux,Rohit Kapur,T.W. Williams +5 more
TL;DR: This paper is the first paper of its kind that treats the scan enable signal as a test data signal during the scan operation of a test pattern and shows that the extra flexibility of reconfiguring the scan chains every shift cycle reduces the number of different configurations required by RSSA while keeping test coverage the same.
Proceedings ArticleDOI
Minimizing the Impact of Scan Compression
Peter Wohl,John A. Waicukauski,Rohit Kapur,Sanjay Ramnath,Emil Gizdarski,T.W. Williams,P. Jaini +6 more
TL;DR: The authors present a scan compression method designed for minimal impact in all aspects: area overhead, timing, and design flow, easily adopted on top of existing scan designs and fully integrated in the scan synthesis and test generation flows.
Proceedings ArticleDOI
Fully X-tolerant, very high scan compression
TL;DR: This paper presents a new X-blocking system which allows very high compression and full coverage even if the density of unknown values is very high and varies every shift.
Patent
Dynamically reconfigurable shared scan-in test architecture
Rohit Kapur,Nodari Sitchinava,Samitha Samaranayake,Emil Gizdarski,Frederic J. Neuveux,Suryanarayana Duggirala,T.W. Williams +6 more
TL;DR: In this article, a low overhead dynamically reconfigurable shared scan-in test architecture is provided, which allows for changing scan inputs during the scan operation on a per-shift basis.