F
F. Panella
Researcher at ARUP Laboratories
Publications - 3
Citations - 36
F. Panella is an academic researcher from ARUP Laboratories. The author has contributed to research in topics: Visual inspection & Automatic identification and data capture. The author has an hindex of 3, co-authored 3 publications receiving 23 citations. Previous affiliations of F. Panella include University College London.
Papers
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Deep learning and image processing for automated crack detection and defect measurement in underground structures
TL;DR: The combination of Deep-Learning (DL) and image processing is presented to produce an automated cracks recognition and defect measurement tool for civil structures.
Journal ArticleDOI
Cost-benefit Analysis of Rail Tunnel Inspection for Photogrammetry and Laser Scanning
TL;DR: The authors argue that the results presented here will push tunnel inspection in the direction of automated approaches with direct benefits on surveying costs as well as Health & Safety (H&S).
Smart Image Based Technology and Deep Learning for Tunnel Inspection and Asset Management
TL;DR: Novel work flows and digital applications have been developed by the authors to create various smart image-based inspection and analysis tools that reduce the potential subjectivity and inconsistency of these inspections.