F
Farhad E. Ghodsi
Researcher at University of Gilan
Publications - 92
Citations - 1830
Farhad E. Ghodsi is an academic researcher from University of Gilan. The author has contributed to research in topics: Thin film & Band gap. The author has an hindex of 21, co-authored 85 publications receiving 1483 citations. Previous affiliations of Farhad E. Ghodsi include Islamic Azad University & Istanbul Technical University.
Papers
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Growth, characterization and studying of sol–gel derived CdS nanoscrystalline thin films incorporated in polyethyleneglycol: Effects of post-heat treatment
TL;DR: In this paper, the CdS nanocrystalline thin films elaborated by sol-gel dip-coating process with a less reported precursor based on polyethyleneglycol matrix were investigated by studying their structural, morphological, compositional, electrical, optical (linear and nonlinear) and photoluminescence properties.
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Optoelectronic studies of sol–gel derived nanostructured CdO–ZnO composite films
TL;DR: In this article, compositional dependence of the optoelectronic properties of sol-gel derived CdO-ZnO composite films with volume ratio of Cd:Zn ranging from 1:0 to 0:1 (with a step of 1/4) has been studied.
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Synthesis and characterization of vanadium doped SnO2 diluted magnetic semiconductor nanoparticles with enhanced photocatalytic activities
TL;DR: In this article, different analytical techniques including TG/DTG, XRD, XPS, VSM and PL were used to investigate the influence of dopant concentration on structural, morphological, compositional, magnetic and optical properties of prepared nanoparticles.
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Comparative Study of ZnO Thin Films Prepared by Different Sol-Gel Route
Farhad E. Ghodsi,H. Absalan +1 more
TL;DR: In this paper, the morphology, optical, and structural properties of the sol-gel made ZnO thin films were studied with respect to the preparation of solgel route, drainage and dip coating technique.
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Fiber-like stripe ATO (SnO2:Sb) nanostructured thin films grown by sol–gel method: Optical, topographical and electrical properties
TL;DR: In this article, the effects of dopant concentration on structural, morphological, electrical, and optical properties of SnO 2 thin films were investigated by using EDX and XPS.