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Filippo Attivissimo

Researcher at Polytechnic University of Bari

Publications -  162
Citations -  2620

Filippo Attivissimo is an academic researcher from Polytechnic University of Bari. The author has contributed to research in topics: Frequency domain & Measurement uncertainty. The author has an hindex of 28, co-authored 150 publications receiving 2226 citations. Previous affiliations of Filippo Attivissimo include Instituto Politécnico Nacional.

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Characterization and Testing of a Tool for Photovoltaic Panel Modeling

TL;DR: The evaluation of the performance, in terms of uncertainty, of a tool designed to estimate the main parameters of a model of a photovoltaic panel (PVP) under real and/or simulated working conditions is presented.
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A Smart Sensor Network for Sea Water Quality Monitoring

TL;DR: A network of smart sensors, based on ISO/IEC/IEEE 21451 suite of standards, for in situ and in continuous space-time monitoring of surface water bodies, in particular for seawater, to capture possible extreme events and collect long-term periods of data.
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Uncertainty Analysis in Photovoltaic Cell Parameter Estimation

TL;DR: A statistical analysis performed by means of a Monte Carlo simulation is in agreement with the theoretical expression of the uncertainty on the series and shunt resistances estimated by the seven-parameter (double diode) model of a photovoltaic cell.
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An acoustic method for soil moisture measurement

TL;DR: The authors have derived the speed-moisture curves, the conditions for the actual validity of the curves, and the suitable sound frequency for performing the measurement, for a wide range of agricultural soils in different physical conditions, and these results are the basis to realize an inexpensive and accurate moisture sensor for farmers.
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FFT test of A/D converters to determine the integral nonlinearity

TL;DR: The use of the fast Fourier transform (FFT) test to measure the integral nonlinearity (INL) of analog-to-digital (A/D) converters is examined and it appears to be very convenient when the device under test has high resolution and a smoothed approximation of the INL is sufficient.