Showing papers by "Francisco Medina published in 1990"

Quasi-TEM analysis of multilayered, multiconductor coplanar structures with dielectric and magnetic anisotropy including substrate losses

Abstract: A quasi-TEM (transverse electromagnetic) analysis of multiconductor planar lines embedded in a layered structure involving lossy iso/anisotropic electric and/or magnetic materials is achieved. Conditions under which a quasi-TEM assumption is valid are theoretically determined. An efficient spectral-domain analysis is used to determine the complex capacitance and inductance matrices characterizing the transmission system. computation of the inductance matrix is reduced to the computation of an equivalent capacitance matrix when media characterized for a fully general permeability tensor are present. It is also shown that most actual monolithic microwave integrated circuit (MMIC) microstrip-type structures (where semiconductor substrates are present) and possible future applications including lossy magnetic materials can be analyzed by using the simple quasi-TEM model. The validity of the results has been verified by comparison with full-wave theoretical and experimental data on microstrip lines on magnetic substrates and slow-wave structures. >

Spectral and variational analysis of generalized cylindrical and elliptical strip and microstrip lines

Abstract: The variational technique in the spectral domain (VTSD) is shown to be an efficient method for computing the quasi-TEM parameters of arbitrary multiconductor and multidielectric cylindrical or elliptical strip configurations. Simple conformal mappings reduce the cylindrical or elliptical geometries to an equivalent rectangular one with periodic boundary conditions. The analysis of this equivalent structure is achieved by taking advantage of previous work on boxed planar structures. The numerical convergence of the programs is greatly accelerated, incorporating the asymptotic behavior of the series appearing in the analysis in such a way that efficient programs have been written. It is pointed out that excessively simple approximations to the surface charge distribution yield meaningful numerical errors, mainly when strong coupling or wide strips are involved. As an application example, the behavior of the characteristic parameters of asymmetric coupled structures on multilayer substrates is shown. >