A system for accessing data remotely from a network In one embodiment, the system comprises a first network interface card permitting data transfer between a local network (70) and an intermediate network (72); a second network interface card permitting data transfer between the intermediate (72) network and a remote network (76); and a module (74) located within the intermediate network (72), through which all data transferring between the local network (70) and the remote network (76) must pass Information transmitted by the remote network (76) may or may not be received and acted upon by the local network (70) depending on a set of predetermined criteria applied by module (74) located within the intermediate network (72)

Customer support network

A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data generated by the electronic devices back to the central test facility, which analyzes the response data to determine which electronic devices passed the testing. The central test facility may provide the results of the testing to other entities, such as a design facility where the electronic devices were designed or a manufacturing facility where the electronic devices where manufactured. The central test facility may accept requests for test resources from any of a number of local test facilities, schedule test times corresponding to each test request, and at a scheduled test time, wirelessly transmits test data to a corresponding local test facility.

Remote Test Facility With Wireless Interface To Local Test Facilities

An assembly for sealingly mounting a device in a hole in a pressure vessel casing, the assembly transferring a load produced by pressurized fluid to the casing and retaining the stem to the casing.

Internally mounted device for a pressure vessel

In complex production environments, such as a semiconductor production facility, allocation of test systems for external control is handled on the basis of an allocation system and technique in which enhanced data integrity is ensured. To this end, direct access to facility internal communication resources is prevented, while nevertheless providing external access to the test systems.

Method and system for customer specific test system allocation in a production environment

A system for accessing data remotely from a network. In one embodiment, the system comprises a first network interface card permitting data transfer between a local network and an intermediate network; a second network interface card permitting data transfer between intermediate network and a remote network; and a module located within the intermediate network, through which all data transferring between the first network and the third network must pass. Information transmitted by the remote network may or may not be received and acted upon by the local network depending on a set of predetermined criteria applied by the intermediate network.

Secure remote diagnostic customer support network

An apparatus is disclosed for remotely monitoring and developing steps in a semiconductor manufacturing process that includes, at least one remote workstation connected via a remote access link to a local workstation, and a test system connected via a link to the local workstation. A method is also disclosed that includes running a semiconductor test system remotely, monitoring the semiconductor test system remotely, and receiving data from the semiconductor test system remotely. Another embodiment includes an apparatus for remotely monitoring and developing steps in a semiconductor manufacturing process. This embodiment includes a plurality of remote workstations each connected via a remote access link to a local workstation, and a test system connected via a link to a local workstation. Security features in this embodiment prevent any one remote workstation from accessing any other remote workstation.

Fredrick W. Crist

Papers

Method and apparatus for remotely testing semiconductors