F
Fu-Yi Tsai
Publications - 6
Citations - 41
Fu-Yi Tsai is an academic researcher. The author has contributed to research in topics: Electrostatic discharge & CMOS. The author has an hindex of 3, co-authored 6 publications receiving 39 citations.
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Proceedings ArticleDOI
On the design of power-rail esd clamp circuit with consideration of gate leakage current in 65-nm low-voltage CMOS process
TL;DR: A new low-leakage power-rail electrostatic discharge (ESD) clamp circuit designed with the consideration of gate-le leakage issue is proposed and verified in a 65-nm low-voltage CMOS process.
Proceedings ArticleDOI
Ultra-low-leakage power-rail ESD clamp circuit in nanoscale low-voltage CMOS process
TL;DR: In this paper, a power-rail ESD clamp circuit with ultra-low-leakage design is presented and verified in a 65-nm CMOS process with a leakage current of only 116nA at 25°C, which is much smaller than that (613μA) of traditional design.
Proceedings ArticleDOI
Board Level ESD of Driver ICS on LCD Panels
TL;DR: In this article, a method utilizing charged device model (CDM) discharging to emulate real-world charged board model discharging was proposed and successfully addressed the weakest spot of whole chip.
Proceedings ArticleDOI
Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits
TL;DR: In this article, an electrical overstress failure induced by a latch-up test was studied in high-voltage integrated cricuits and solutions were proposed to avoid the triggering of the output NMOSFET and the resulting latchup issue.
Proceedings ArticleDOI
Failure analysis on gate-driven ESD clamp circuit after TLP stresses of different voltage steps in a 16-V CMOS process
TL;DR: In this paper, the ESD robustness of gate-driven ESD clamp circuit in a 16-V CMOS process was investigated by the stresses of transmission line pulse (TLP), human-body-model ESD test, and machine-model (MM) test.