scispace - formally typeset
G

Gary Lorden

Researcher at California Institute of Technology

Publications -  15
Citations -  2098

Gary Lorden is an academic researcher from California Institute of Technology. The author has contributed to research in topics: Sequential probability ratio test & Sample size determination. The author has an hindex of 13, co-authored 14 publications receiving 1923 citations.

Papers
More filters
Journal ArticleDOI

Procedures for reacting to a change in distribution

TL;DR: In this paper, a problem of optimal stopping is formulated and simple rules are proposed which are asymptotically optimal in an appropriate sense, which is of central importance in quality control and also has applications in reliability theory.
Journal ArticleDOI

On Excess Over the Boundary

TL;DR: In this article, an upper bound on the mean of the excess, uniform in t, when a random walk is stopped is given, where t is the time when the walk is over a threshold.
Journal ArticleDOI

2-SPRT'S and The Modified Kiefer-Weiss Problem of Minimizing an Expected Sample Size

Gary Lorden
- 01 Mar 1976 - 
TL;DR: In this article, a simple combination of one-sided sequential probability ratio tests, called a 2-SPRT, is shown to approximately minimize the expected sample size at a given point θ 0 among all tests with error probabilities controlled at two other points, θ 1 and θ 2.
Journal ArticleDOI

Nearly-optimal sequential tests for finitely many parameter values

Gary Lorden
- 01 Jan 1977 - 
TL;DR: In this article, the authors combine one-sided sequential probability ratio tests (SPRTs) for binomial decision problems with error probability constraints to minimize the expected sample sizes to within o(1) asymptotically.
Journal ArticleDOI

Nonanticipating estimation applied to sequential analysis and changepoint detection

Gary Lorden, +1 more
- 01 Jun 2005 - 
TL;DR: In this paper, the authors apply an idea of Robbins and Siegmund [Proc. 6th Berkeley Symp. Math. Statist. 4 (1972) 37-41] to construct a class of sequential tests and detection schemes whereby the unknown post-change parameters are estimated.